Fretting wear and fretting fatigue behaviors of diamond-like carbon and graphite-like carbon films deposited on Ti-6Al-4V alloy

2014 ◽  
Vol 313 ◽  
pp. 462-469 ◽  
Author(s):  
Dongxing Du ◽  
Daoxin Liu ◽  
Zuoyan Ye ◽  
Xiaohua Zhang ◽  
Fanqiao Li ◽  
...  
Keyword(s):  
Fretting Fatigue ◽  
Carbon Films ◽  
Fretting Wear ◽  
Diamond Like Carbon ◽  
Carbon And Graphite

The Effects of Diamond-Like Carbon Films on Fretting Wear Behavior of Orthodontic Archwire-Bracket Contacts

2015 ◽  
Vol 15 (6) ◽  
pp. 4641-4647 ◽  
Author(s):  
Ting Kang ◽  
Shi-You Huang ◽  
Jie-Jie Huang ◽  
Qi-Hong Li ◽  
Dong-Feng Diao ◽  
...  
Keyword(s):  
Wear Behavior ◽  
Carbon Films ◽  
Fretting Wear ◽  
Diamond Like Carbon

Field Emission from Pure and Nitrogen-Incorporated Diamond-Like-Carbon Films

1996 ◽  
Vol 06 (C5) ◽  
pp. C5-91-C5-95 ◽  
Author(s):  
S. Lee ◽  
B. Chung ◽  
T.-Y. Ko ◽  
H. Cho ◽  
D. Jeon ◽  
...  
Keyword(s):  
Field Emission ◽  
Carbon Films ◽  
Diamond Like Carbon

Microstructure Evolution Induced by Ultraviolet Light Irradiation in Ti-Si Codoped Diamond-like Carbon films

2014 ◽  
Vol 29 (9) ◽  
pp. 941
Author(s):  
JIANG Jin-Long ◽  
WANG Qiong ◽  
HUANG Hao ◽  
ZHANG Xia ◽  
WANG Yu-Bao ◽  
...  
Keyword(s):  
Ultraviolet Light ◽  
Microstructure Evolution ◽  
Carbon Films ◽  
Light Irradiation ◽  
Diamond Like Carbon ◽  
Ultraviolet Light Irradiation

An Study of Influence of Imperfections on the Delamination of Diamond-Like Carbon Films

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh
Keyword(s):  
Cross Sections ◽  
Focused Ion Beam ◽  
Imaging System ◽  
Ion Beam ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Glass Substrates ◽  
Atomic Force ◽  
Initiation And Propagation

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.

Low Temperature Internal Friction of Diamond-Like Carbon Films

2002 ◽  
Author(s):  
Xiao Liu ◽  
D. M. Photiadis ◽  
J. A. Bucaro ◽  
J. F. Vignola ◽  
B. H. Houston ◽  
...  
Keyword(s):  
Low Temperature ◽  
Internal Friction ◽  
Carbon Films ◽  
Diamond Like Carbon

The influence of Cr and Ni doping on the microstructure of oxygen containing diamond-like carbon films

Vacuum ◽  
2021 ◽  
pp. 110351
Author(s):  
Vilius Dovydaitis ◽  
Liutauras Marcinauskas ◽  
Paola Ayala ◽  
Enrico Gnecco ◽  
Johnny Chimborazo ◽  
...  
Keyword(s):  
Carbon Films ◽  
Diamond Like Carbon ◽  
Ni Doping

scholarly journals Characterization of Ultra-Thin Diamond-Like Carbon Films by SEM/EDX

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 729
Author(s):  
Chanida Puttichaem ◽  
Guilherme P. Souza ◽  
Kurt C. Ruthe ◽  
Kittipong Chainok
Keyword(s):  
Regression Models ◽  
Hard Disk Drives ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Disk Drives ◽  
Cross Sectional ◽  
Protective Films ◽  
High Throughput Method ◽  
Multiple Regression Models

A novel, high throughput method to characterize the chemistry of ultra-thin diamond-like carbon films is discussed. The method uses surface sensitive SEM/EDX to provide substrate-specific, semi-quantitative silicon nitride/DLC stack composition of protective films extensively used in the hard disk drives industry and at Angstrom-level. SEM/EDX output is correlated to TEM to provide direct, gauge-capable film thickness information using multiple regression models that make predictions based on film constituents. The best model uses the N/Si ratio in the films, instead of separate Si and N contributions. Topography of substrate/film after undergoing wear is correlatively and compositionally described based on chemical changes detected via the SEM/EDX method without the need for tedious cross-sectional workflows. Wear track regions of the substrate have a film depleted of carbon, as well as Si and N in the most severe cases, also revealing iron oxide formation. Analysis of film composition variations around industry-level thicknesses reveals a complex interplay between oxygen, silicon and nitrogen, which has been reflected mathematically in the regression models, as well as used to provide valuable insights into the as-deposited physics of the film.

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