Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements
2013 ◽
Vol 274
◽
pp. 405-417
◽
2012 ◽
pp. 289-293
Keyword(s):
2007 ◽
Vol 46
(3)
◽
pp. 227-235
◽
2004 ◽
Vol 238
(1-4)
◽
pp. 269-272
◽
2008 ◽
Vol 22
(30)
◽
pp. 3007-3013
◽
2013 ◽
Vol 583
◽
pp. 95-100
◽
Keyword(s):