Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography

2012 ◽  
Vol 259 ◽  
pp. 726-730 ◽  
Author(s):  
T. Kinno ◽  
H. Akutsu ◽  
M. Tomita ◽  
S. Kawanaka ◽  
T. Sonehara ◽  
...  
Keyword(s):  
Thin Film ◽  
Atom Probe Tomography ◽  
Quantitative Measurement ◽  
Atom Probe

scholarly journals Preferred location for conducting filament formation in thin-film nano-ionic electrolyte: study of microstructure by atom-probe tomography

2017 ◽  
Vol 28 (9) ◽  
pp. 6846-6851 ◽  
Author(s):  
Jiri Orava ◽  
Yuren Wen ◽  
Jan Prikryl ◽  
Tomas Wagner ◽  
Nadia A. Stelmashenko ◽  
...  
Keyword(s):  
Thin Film ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Filament Formation ◽  
Conducting Filament

scholarly journals Application of Atom Probe Tomography in Understanding Thin Film Chemical Ordering and Stress Behavior

2011 ◽  
Vol 17 (S2) ◽  
pp. 732-733
Author(s):  
G Thompson ◽  
B Fu ◽  
D Means ◽  
B Wang
Keyword(s):  
Thin Film ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Chemical Ordering ◽  
Stress Behavior

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

scholarly journals Nanoscale compositional analysis of wurtzite BAlN thin film using atom probe tomography

2020 ◽  
Vol 117 (23) ◽  
pp. 232103
Author(s):  
Jith Sarker ◽  
Tinh Binh Tran ◽  
Feras AlQatari ◽  
Che-Hao Liao ◽  
Xiaohang Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Atom Probe Tomography ◽  
Compositional Analysis ◽  
Atom Probe

scholarly journals Laser-assisted atom probe tomography of 18O-enriched oxide thin film for quantitative analysis of oxygen

2014 ◽  
Vol 290 ◽  
pp. 194-198 ◽  
Author(s):  
T. Kinno ◽  
M. Tomita ◽  
T. Ohkubo ◽  
S. Takeno ◽  
K. Hono
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Oxide Thin Film

scholarly journals 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography

2016 ◽  
Vol 102 ◽  
pp. 32-37 ◽  
Author(s):  
Adam Stokes ◽  
Mowafak Al-Jassim ◽  
David R. Diercks ◽  
Brian Egaas ◽  
Brian Gorman
Keyword(s):  
Thin Film ◽  
Point Defect ◽  
Atom Probe Tomography ◽  
Defect Density ◽  
Atom Probe ◽  
Density Distributions

Thin film underlayer effects on mass resolving power in laser-assisted atom probe tomography

2014 ◽  
Vol 551 ◽  
pp. 32-36 ◽  
Author(s):  
K. Tippey ◽  
J.G. Brons ◽  
M. Kapoor ◽  
B. Fu ◽  
G.B. Thompson
Keyword(s):  
Thin Film ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Resolving Power ◽  
Mass Resolving Power
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