In situ AFM and Raman spectroscopy study of the crystallization behavior of Ge2Sb2Te5 films at different temperature
2011 ◽
Vol 258
(4)
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pp. 1619-1623
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2012 ◽
Vol 10
(8)
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pp. 083001-83004
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2011 ◽
Vol 18
(8)
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pp. 1981-1989
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Keyword(s):
2020 ◽
Vol 1210
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pp. 128043
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