Analysis of ITO/Mg:GaN interfaces by synchrotron radiation hard X-ray photoemission spectroscopy and their electrical characteristics
2008 ◽
Vol 255
(5)
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pp. 2149-2152
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Keyword(s):
X Ray
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1996 ◽
Vol 29
(1)
◽
pp. 133-146
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2010 ◽
Vol 114
(49)
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pp. 21450-21456
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Keyword(s):
2003 ◽
Vol 21
(4)
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pp. 1876
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Keyword(s):
1997 ◽
Vol 04
(01)
◽
pp. 25-31
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2017 ◽
Vol 50
(11)
◽
pp. 118001
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