Static time-of-flight secondary ion mass spectrometry analysis of microelectronics related substrates using a polyatomic ion source

2008 ◽  
Vol 255 (4) ◽  
pp. 1440-1442 ◽  
Author(s):  
X. Ravanel ◽  
C. Trouiller ◽  
M. Juhel ◽  
C. Wyon ◽  
L.F.Tz. Kwakman ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Source ◽  
Mass Spectrometry Analysis ◽  
Spectrometry Analysis ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Calculation of Membrane Lipid Ratios Using Single-Pixel Time-of-Flight Secondary Ion Mass Spectrometry Analysis

2015 ◽  
Vol 87 (15) ◽  
pp. 7795-7802 ◽  
Author(s):  
Rainer Kassenböhmer ◽  
Felix Draude ◽  
Martin Körsgen ◽  
Andreas Pelster ◽  
Heinrich F. Arlinghaus
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Membrane Lipid ◽  
Mass Spectrometry Analysis ◽  
Spectrometry Analysis ◽  
Lipid Ratios ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Single Pixel
Sign in / Sign up

Export Citation Format

Share Document