Ellipsometric characterization of nanocrystals in porous silicon
2006 ◽
Vol 253
(1)
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pp. 200-203
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Keyword(s):
2000 ◽
Vol 69-70
◽
pp. 182-187
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2021 ◽
Vol 1829
(1)
◽
pp. 012021
2021 ◽
Vol 1126
(1)
◽
pp. 012006
2000 ◽
Vol 182
(1)
◽
pp. 473-477
◽
2018 ◽
Vol 1003
◽
pp. 012087
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