Ellipsometric characterization of nanocrystals in porous silicon

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pp. 200-203 ◽  
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Vol 69-70 ◽  
pp. 182-187 ◽  
Author(s):  
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P Petrik ◽  
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UDAY MUHSIN NAYEF

2000 ◽  
Vol 182 (1) ◽  
pp. 473-477 ◽  
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F. Cerullo ◽  
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2009 ◽  
Vol 9 (3) ◽  
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V. Verdoold ◽  
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Vol 1003 ◽  
pp. 012087 ◽  
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Alwan M Alwan ◽  
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