Electrical properties of MOS structures on nitrogen-doped Czochralski-grown silicon: A positron annihilation study
2006 ◽
Vol 252
(9)
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pp. 3201-3208
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2006 ◽
Vol 37
(4)
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pp. 283-289
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2007 ◽
Vol 42
(17)
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pp. 7109-7115
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1996 ◽
Vol 47
(3)
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pp. 399-403
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2007 ◽
Vol 136
(2)
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pp. 613-617
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Keyword(s):
1997 ◽
Vol 116
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pp. 335-339
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