Analyses of thin films and surfaces by cold neutron depth profiling

2004 ◽  
Vol 238 (1-4) ◽  
pp. 108-112 ◽  
Author(s):  
G.P. Lamaze ◽  
H.H. Chen-Mayer ◽  
K.K. Soni
Keyword(s):  
Thin Films ◽  
Cold Neutron ◽  
Depth Profiling ◽  
Neutron Depth Profiling

The new cold neutron depth profiling instrument at NIST

1992 ◽  
Vol 160 (2) ◽  
pp. 315-325 ◽  
Author(s):  
G. P. Lamaze ◽  
R. G. Downing ◽  
J. K. Langland ◽  
S. T. Hwang
Keyword(s):  
Cold Neutron ◽  
Depth Profiling ◽  
Neutron Depth Profiling

Neutron Depth Profiling with the New NIST Cold Neutron Source

1997 ◽  
Vol 25 (3) ◽  
pp. 217-220 ◽  
Author(s):  
G. P. Lamaze ◽  
H. Chen-Mayer ◽  
J. K. Langland ◽  
R. G. Downing
Keyword(s):  
Neutron Source ◽  
Cold Neutron ◽  
Depth Profiling ◽  
Neutron Depth Profiling ◽  
Cold Neutron Source

Analysis of cubic boron nitride thin films by neutron depth profiling

1994 ◽  
Vol 3 (4-6) ◽  
pp. 728-731 ◽  
Author(s):  
G.P. Lamaze ◽  
R.G. Downing ◽  
L.B. Hackenberger ◽  
L.J. Pilione ◽  
R. Messier
Keyword(s):  
Thin Films ◽  
Boron Nitride ◽  
Cubic Boron Nitride ◽  
Depth Profiling ◽  
Neutron Depth Profiling

Cold neutron depth profiling of lithium-ion battery materials

2003 ◽  
Vol 119-121 ◽  
pp. 680-685 ◽  
Author(s):  
G.P Lamaze ◽  
H.H Chen-Mayer ◽  
D.A Becker ◽  
F Vereda ◽  
R.B Goldner ◽  
...  
Keyword(s):  
Lithium Ion Battery ◽  
Cold Neutron ◽  
Depth Profiling ◽  
Lithium Ion ◽  
Neutron Depth Profiling ◽  
Battery Materials

scholarly journals Cold-neutron depth profiling as a research tool for the study of surface oxides on metalsSpecial Issue on Neutron Scattering in Canada.

2010 ◽  
Vol 88 (10) ◽  
pp. 751-758 ◽  
Author(s):  
Z. Tun ◽  
J. J. Noël ◽  
Th. Bohdanowicz ◽  
L. R. Cao ◽  
R. G. Downing ◽  
...  
Keyword(s):  
Data Collection ◽  
Recent Experiment ◽  
Cold Neutron ◽  
Depth Profiling ◽  
Substantial Improvement ◽  
Active Oxygen ◽  
Neutron Depth Profiling ◽  
Surface Oxides ◽  
Passive Oxides ◽  
Α Particles

A recent experiment at NIST has demonstrated that neutron depth profiling (NDP) based on the (n, α) reaction could be developed into a tool that could be routinely used for the study of passive oxides on metals. Whereas most metals are not (n, α) active, oxides grown with 17O, the only (n, α) active oxygen isotope, can be observed and tracked by this technique. Problems due to contamination of the samples by boron were encountered, but were shown to be surmountable. For our samples, the NDP facility at NIST, as it exists today, has enough flux and energy resolution to separate the α particles emitted by 17O from those emitted by 10B. Substantial improvement in the data collection rate, easily achievable with arrays of additional detectors, will make NDP a useful tool in the study of passive oxides.

scholarly journals Effect of the molecular weight on the depth profiling of PMMA thin films using low‐energy Cs + sputtering

2021 ◽  
Author(s):  
Amal Ben Hadj Mabrouk ◽  
Christophe Licitra ◽  
Antoine Chateauminois ◽  
Marc Veillerot
Keyword(s):  
Thin Films ◽  
Molecular Weight ◽  
Depth Profiling ◽  
Low Energy
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