Principal component analysis of TOF-SIMS spectra, images and depth profiles: an industrial perspective

2004 ◽  
Vol 231-232 ◽  
pp. 235-239 ◽  
Author(s):  
Michaeleen L. Pacholski
Keyword(s):  
Principal Component Analysis ◽  
Principal Component ◽  
Component Analysis ◽  
Depth Profiles ◽  
Tof Sims

Application of principal component analysis and tof-sims to mineral recognition, surface chemistry and separation by flotation

2006 ◽  
Vol 70 (18) ◽  
pp. A597 ◽  
Author(s):  
Roger St. C. Smart ◽  
Brian Hart ◽  
Mark Biesinger ◽  
James Francis ◽  
Tesfaye Negeri
Keyword(s):  
Principal Component Analysis ◽  
Surface Chemistry ◽  
Principal Component ◽  
Component Analysis ◽  
Tof Sims

Principal Component Analysis (PCA) of Surface Contamination by TOF-SIMS

2021 ◽  
Author(s):  
Kei Lin Sek ◽  
Pei Lin Lee ◽  
Khin Yin Pang ◽  
Younan Hua ◽  
Lei Zhu ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Principal Component ◽  
Component Analysis ◽  
Surface Contamination ◽  
Tof Sims

Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

2019 ◽  
Vol 1 (7) ◽  
pp. 1821-1828 ◽  
Author(s):  
Céline Noël ◽  
Nunzio Tuccitto ◽  
Yan Busby ◽  
Manuel Auer-Berger ◽  
Antonino Licciardello ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Principal Component ◽  
Component Analysis ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Tof Sims ◽  
Organic Light
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