A new passive sample and hold structure for high-speed, high-resolution ADCs

2011 ◽  
Vol 65 (10) ◽  
pp. 799-805 ◽  
Author(s):  
Khosrov Dabbagh Sadeghipour
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Sample And Hold ◽  
Passive Sample

A new high-speed, high-resolution open-loop CMOS sample and hold

2013 ◽  
Vol 78 (2) ◽  
pp. 409-419 ◽  
Author(s):  
Alireza Abolhasani ◽  
Mohammad Tohidi ◽  
Khayrollah Hadidi ◽  
Abdollah Khoei
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Open Loop ◽  
Sample And Hold

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

High-speed high-resolution CMOS voltage comparator

1986 ◽  
Vol 22 (6) ◽  
pp. 338 ◽  
Author(s):  
W.T. Ng ◽  
C.A.T. Salama
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Voltage Comparator

A High Speed, High Resolution Remote MCA

1985 ◽  
Vol 32 (1) ◽  
pp. 100-104
Author(s):  
D. J. Roberts ◽  
J. J. Gregorio
Keyword(s):  
High Resolution ◽  
High Speed
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