Analysis of haptic perception of materials by multidimensional scaling and physical measurements of roughness and compressibility

Wouter M. Bergmann Tiest; Astrid M.L. Kappers

doi:10.1016/j.actpsy.2005.04.005

Perceptual Dimensions Underlying Vowel Lipreading Performance

Journal of Speech and Hearing Research ◽

10.1044/jshr.1904.796 ◽

1976 ◽

Vol 19 (4) ◽

pp. 796-812 ◽

Cited By ~ 20

Author(s):

Pamela L. Jackson ◽

Allen A. Montgomery ◽

Carl A. Binnie

Keyword(s):

Multidimensional Scaling ◽

Normal Hearing ◽

Visual Similarity ◽

Perceptual Features ◽

Physical Measurements ◽

Separation Feature

This study was concerned with the extraction, description, and verification of visual perceptual features underlying vowel lipreading performance. Ten viewers with normal hearing rated the visual similarity of pairs of 15 vowels and diphthongs presented in an /h_g/ context by four speakers. Multidimensional scaling techniques were used to extract potential perceptual features which were then labeled by the experimenters. The resulting perceptual dimensions were correlated with physical measurements of lip shape to evaluate the adequacy of the feature labels. The results indicated that the traditional extended-rounded vowel feature and a vertical lip separation feature were the characteristics most prominent in judging the stimuli. In addition, a feature related to overall area of maximum lip opening and two features unique to diphthong perception were tentatively identified.

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Analysis of haptic perception of materials by physical measurements

The Proceedings of the Annual Convention of the Japanese Psychological Association ◽

10.4992/pacjpa.81.0_3a-038 ◽

2017 ◽

Vol 81 (0) ◽

pp. 3A-038-3A-038

Author(s):

Keiko Sato ◽

Haruka Shinomiya ◽

Kazuki Watatani ◽

Tomohiro Onishi ◽

Hidekuni Takao

Keyword(s):

Haptic Perception ◽

Physical Measurements

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An Improved Quantitative Image Analyser

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078663 ◽

1977 ◽

Vol 35 ◽

pp. 226-227

Author(s):

J.P. Fallon ◽

P.J. Gregory ◽

C.J. Taylor

Keyword(s):

Feature Extraction ◽

Quantitative Analysis ◽

Frequency Content ◽

General Sense ◽

Physical Measurements ◽

Quantitative Image ◽

Image Analyser ◽

Automatic Methods ◽

Quantitative Results

Quantitative image analysis systems have been used for several years in research and quality control applications in various fields including metallurgy and medicine. The technique has been applied as an extension of subjective microscopy to problems requiring quantitative results and which are amenable to automatic methods of interpretation.Feature extraction. In the most general sense, a feature can be defined as a portion of the image which differs in some consistent way from the background. A feature may be characterized by the density difference between itself and the background, by an edge gradient, or by the spatial frequency content (texture) within its boundaries. The task of feature extraction includes recognition of features and encoding of the associated information for quantitative analysis.Quantitative Analysis. Quantitative analysis is the determination of one or more physical measurements of each feature. These measurements may be straightforward ones such as area, length, or perimeter, or more complex stereological measurements such as convex perimeter or Feret's diameter.

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High resolution surface structure of foot-and-mouth disease virus

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100082741 ◽

1978 ◽

Vol 36 (2) ◽

pp. 376-377

Author(s):

S. S. Breese ◽

H. L. Bachrach

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Surface Structure ◽

Disease Virus ◽

Potassium Phosphate ◽

Foot And Mouth Disease ◽

Mouth Disease ◽

Physical Measurements ◽

Mouth Disease Virus ◽

Foot And Mouth

Models for the structure of foot-and-mouth disease virus (FMDV) have been proposed from chemical and physical measurements (Brown, et al., 1970; Talbot and Brown, 1972; Strohmaier and Adam, 1976) and from rotational image-enhancement electron microscopy (Breese, et al., 1965). In this report we examine the surface structure of FMDV particles by high resolution electron microscopy and compare it with that of particles in which the outermost capsid protein VP3 (ca. 30, 000 daltons) has been split into smaller segments, two of which VP3a and VP3b have molecular weights of about 15, 000 daltons (Bachrach, et al., 1975).Highly purified and concentrated type A12, strain 119 FMDV (5 mg/ml) was prepared as previously described (Bachrach, et al., 1964) and stored at 4°C in 0. 2 M KC1-0. 5 M potassium phosphate buffer at pH 7. 5. For electron microscopy, 1. 0 ml samples of purified virus and trypsin-treated virus were dialyzed at 4°C against 0. 2 M NH4OAC at pH 7. 3, deposited onto carbonized formvar-coated copper screens and stained with phosphotungstic acid, pH 7. 3.

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Quantitation in thin Sections Within the Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100091664 ◽

1976 ◽

Vol 34 ◽

pp. 336-337

Author(s):

J. Edie

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Electron Scattering ◽

Volume Density ◽

Thin Sections ◽

Faraday Cage ◽

Local Mass ◽

Physical Measurements ◽

Mass Volume ◽

Varying Mass

In TEM image formation, the observed contrast variations within thin sections result from differential electron scattering within microregions of varying mass thickness. It is possible to utilize these electron scattering properties to obtain objective information regarding various specimen parameters (1, 2, 3).A pragmatic, empirical approach is described which enables a microscopist to perform physical measurements of thickness of thin sections and estimates of local mass, volume, density and, possibly, molecular configurations within thin sections directly in the microscope. A Faraday cage monitors the transmitted electron beam and permits measurements of electron beam intensities.

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Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100173078 ◽

1994 ◽

Vol 52 ◽

pp. 1068-1069

Author(s):

S. P. Sapers ◽

R. Clark ◽

P. Somerville

Keyword(s):

Thin Film ◽

Thin Films ◽

Thermal Control ◽

Scanning Probe Microscope ◽

Scanning Probe ◽

List Type ◽

Manufacturing Environment ◽

Physical Measurements ◽

Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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