Determination of trace elements in high-purity quartz samples by ICP-OES and ICP-MS: A normal-pressure digestion pretreatment method for eliminating unfavorable substrate Si
2004 ◽
Vol 514
(1)
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pp. 115-124
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2008 ◽
Vol 49
(9)
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pp. 2054-2057
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2011 ◽
Vol 26
(12)
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pp. 2404
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2009 ◽
Vol 73
(1)
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pp. 15-18
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2004 ◽
Vol 45
(3)
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pp. 925-929
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