Trace element determination using static high-sensitivity inductively coupled plasma optical emission spectrometry (SHIP-OES)

2007 ◽  
Vol 583 (2) ◽  
pp. 319-325 ◽  
Author(s):  
Carsten Engelhard ◽  
Andy Scheffer ◽  
Sascha Nowak ◽  
Torsten Vielhaber ◽  
Wolfgang Buscher
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