Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm

Author(s):  
Karthik Pandaram ◽  
S. Rathnapriya ◽  
V. Manikandan
2014 ◽  
Vol 981 ◽  
pp. 3-10 ◽  
Author(s):  
Yuan Gao ◽  
Cheng Lin Yang ◽  
Shu Lin Tian

Soft fault diagnosis and tolerance are two challenging problems in linear analog circuit fault diagnosis. To solve these problems, a phasor analysis based fault modeling method and its theoretical proof are presented at first. Second, to form fault feature data base, the differential voltage phasor ratio (DVPR) is decomposed into real and imaginary parts. Optimal feature selection method and testability analysis method are used to determine the optimal fault feature data base. Statistical experiments prove that the proposed fault modeling method can improve the fault diagnosis robustness. Then, Multi-class support vector machine (SVM) classifiers are used for fault diagnosis. The effectiveness of the proposed approaches is verified by both simulated and experimental results.


Measurement ◽  
2019 ◽  
Vol 131 ◽  
pp. 714-722 ◽  
Author(s):  
Michał Tadeusiewicz ◽  
Stanisław Hałgas

2008 ◽  
Vol 17 (05) ◽  
pp. 905-928 ◽  
Author(s):  
N. SARAT CHANDRA BABU ◽  
V. C. PRASAD ◽  
S. P. VENU MADHAVA RAO ◽  
K. LAL KISHORE

An efficient method to eliminate redundant frequencies present in one of the existing multi-frequency methods for analog fault diagnosis is proposed in this paper. First the two-dimensional fault dictionary is constructed where entries are gain signatures of all faults and frequencies. The faults belonging to the same quantization levels are numbered sequentially and a frequency that has an ambiguity set with the highest number faults is eliminated after verifying that there are no repetitions after the deletion of this frequency. In this manner, all frequencies are examined for deletion. Finally the test frequencies, which cannot be deleted, remain resulting in a minimal set of test frequencies of a network to isolate a given set of faults. Another method proposes a technique, which generates more number of frequencies to isolate all the faults, if the test frequencies generated using the existing methods are not sufficient.


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