Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction

2001 ◽  
Vol 21 (2) ◽  
pp. 185-190 ◽  
Author(s):  
V. Chamard ◽  
C. Pichat ◽  
G. Dolino
Keyword(s):  
High Resolution ◽  
Porous Silicon ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

In-situ Investigation of Bainite Formation with fast X-Ray Diffraction (iXRD)

2017 ◽  
Vol 72 (6) ◽  
pp. 355-364
Author(s):  
A. Kopp ◽  
T. Bernthaler ◽  
D. Schmid ◽  
G. Ketzer-Raichle ◽  
G. Schneider
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Direct In Situ Investigation of Milling Reactions Using Combined X-ray Diffraction and Raman Spectroscopy

2014 ◽  
Vol 54 (6) ◽  
pp. 1799-1802 ◽  
Author(s):  
Lisa Batzdorf ◽  
Franziska Fischer ◽  
Manuel Wilke ◽  
Klaus-Jürgen Wenzel ◽  
Franziska Emmerling
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

Transformation of ferrihydrite to hematite: anin situinvestigation on the kinetics and mechanisms

2008 ◽  
Vol 72 (1) ◽  
pp. 217-220 ◽  
Author(s):  
H. P. Vu ◽  
S. Shaw ◽  
L. G. Benning
Keyword(s):  
High Resolution ◽  
Growth Mechanism ◽  
Elevated Temperatures ◽  
X Ray Diffraction ◽  
Electron Microscopic ◽  
Time Resolved ◽  
X Ray ◽  
Resolution Electron ◽  
Stage Process

AbstractThe kinetics and mechanisms of the transformation of 2-line ferrihydrite (FH) to hematite (HM), in the presence of Pb at elevated temperatures and high pH condition, were elucidated using synchrotron-based,in situenergy dispersive X-ray diffraction (EDXRD). The time-resolved diffraction data indicated that HM crystallization occurred via a two-stage process. Based on the EDXRD data, combined with high-resolution electron microscopic images, an aqueous-aided 2D growth mechanism is proposed for both HM crystallization stages.

Effects of Phosphorus Exposure on Arsenic-Stabilized GaAs 2×4 Surface

1993 ◽  
Vol 312 ◽  
Author(s):  
A. H. Bensaoula ◽  
A. Freundlich ◽  
A. Bensaoula ◽  
V. Rossignol
Keyword(s):  
High Resolution ◽  
Electron Diffraction ◽  
Growth Process ◽  
High Energy ◽  
Ex Situ ◽  
Chemical Beam Epitaxy ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
X Ray

AbstractPhosphorus exposed GaAs (100) surfaces during a Chemical Beam Epitaxy growth process are studied using in-situ Reflection High Energy Electron Diffraction and ex-situ High Resolution X-ray Diffraction. It is shown that the phosphorus exposure of a GaAs (100) surface in the 500 – 580 °C temperature range results in the formation of one GaP monolayer.

In situ investigation of MnAs/GaAs(001) growth and interface structure using synchrotron x-ray diffraction

2004 ◽  
Vol 22 (4) ◽  
pp. 2079 ◽  
Author(s):  
D. K. Satapathy ◽  
B. Jenichen ◽  
V. M. Kaganer ◽  
W. Braun ◽  
L. Däweritz ◽  
...  
Keyword(s):  
Interface Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation
Sign in / Sign up

Export Citation Format

Share Document