Meeting of the Australian Scanned Probe Microscope Society, University of Sydney, February 16–19, 1999: Introduction

In February 1999, the second Scanned Probe Microscopy conference (SPM II) of the Australian Scanned Probe Microscope Society was held in Sydney, Australia, in conjunction with the fifth biennial symposium of the Australian Microbeam Analysis Society (AMAS V). This issue of Microscopy and Microanalysis presents selected full-length papers arising from that meeting.