Weathering Phenomena on Naturally Weathered Potash-Lime-Silica-Glass with Medieval Composition Studied by Secondary Electron Microscopy and Energy Dispersive Microanalysis

2000 ◽  
Vol 135 (3-4) ◽  
pp. 121-130 ◽  
Author(s):  
Gebhard Woisetschl�ger ◽  
Myriam Dutz ◽  
Sabine Paul ◽  
Manfred Schreiner
Keyword(s):  
Electron Microscopy ◽  
Silica Glass ◽  
Secondary Electron ◽  
Energy Dispersive ◽  
Energy Dispersive Microanalysis

scholarly journals STUDI SCANNING ELECTRON MICROSCOPY (SEM) UNTUK KARAKTERISASI PROSES OXIDASI PADUAN ZIRKONIUM

2017 ◽  
Vol 9 (1) ◽  
pp. 44
Author(s):  
Agus Sujatno ◽  
Rohmad Salam ◽  
Bandriyana Bandriyana ◽  
Arbi Dimyati
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Secondary Electron ◽  
Energy Dispersive ◽  
X Ray ◽  
Backscattered Electron ◽  
Scanning Electron

STUDI SCANNING ELEKTRON MICROSCOPY (SEM) UNTUK KARAKTERISASI PROSES OXIDASI PADUAN ZIRKONIUM. Studi analisis Scanning Electron Microscopy (SEM) telah dilakukan untuk mengkarakterisasi struktur mikro dan lapisan oksida paduan zirkonium, bahan yang prospektif digunakan sebagai material kelongsong bahan bakar reaktor nuklir generasi ke IV dan struktur reaktor fusi modern. Tujuan penelitian adalah guna mendapatkan informasi yang detil dan akurat yang diperlukan untuk mendukung analisis ketahanan korosi paduan zirkonium yang disebabkan oleh proses oksidasi suhu tinggi dengan menggunakan berbagai metode analisis pada SEM. Sampel uji yang digunakan adalah ingot paduan zirkonium ZrNbMoGe setelah tes oksidasi dalam Mass Suspension Balance (MSB) pada temperatur 500 dan 700 oC masing-masing selama 5 jam. Komposisi unsur dalam sampel paduan adalah 96,9 %Zr, 2,5 %Nb, 0,5 %Mo dan 0,1 %Ge. Pengujian SEM dilakukan dengan JEOL JSM-6510LA yang dilengkapi dengan perangkat Energy Dispersive X-Ray Spectroscopy (EDS) untuk analisis komposisi kimia. Metode Secondary Electron (SE) dan Backscattered Electron (BSE) dengan opsi Low-Vacuum dilakukan untuk mendapatkan kontras yang optimal. Hasil analisa menunjukan bahwa pada kedua sampel telah tumbuh lapisan oksida berupa ZrO2 dengan ketebalan maksimal 2.4 dan 3.5 mm untuk masing-masing temperatur 500 dan 700 oC. Gambar BSE telah menunjukan batas lapisan dengan jelas, tidak memberikan ruang untuk interpretasi ganda.

Scanning Electron Microscopy-cuticular Lesions on the Roundworm Ascaris Suum

1970 ◽  
Vol 28 ◽  
pp. 114-115
Author(s):  
P. A. Madden ◽  
W. R. Anderson
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Freeze Drying ◽  
Room Temperature ◽  
Secondary Electron ◽  
Distilled Water ◽  
Freeze Dried ◽  
Silver Paint ◽  
To Come ◽  
Scanning Electron

The intestinal roundworm of swine is pinkish in color and about the diameter of a lead pencil. Adult worms, taken from parasitized swine, frequently were observed with macroscopic lesions on their cuticule. Those possessing such lesions were rinsed in distilled water, and cylindrical segments of the affected areas were removed. Some of the segments were fixed in buffered formalin before freeze-drying; others were freeze-dried immediately. Initially, specimens were quenched in liquid freon followed by immersion in liquid nitrogen. They were then placed in ampuoles in a freezer at −45C and sublimated by vacuum until dry. After the specimens appeared dry, the freezer was allowed to come to room temperature slowly while the vacuum was maintained. The dried specimens were attached to metal pegs with conductive silver paint and placed in a vacuum evaporator on a rotating tilting stage. They were then coated by evaporating an alloy of 20% palladium and 80% gold to a thickness of approximately 300 A°. The specimens were examined by secondary electron emmission in a scanning electron microscope.

High Resolution Low Loss Microscopy of Crystalline Surfaces

1980 ◽  
Vol 38 ◽  
pp. 162-163
Author(s):  
William Krakow ◽  
Alec N. Broers
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Surface Topography ◽  
Secondary Electron ◽  
Objective Lens ◽  
Surface Imaging ◽  
Low Loss ◽  
Fine Grained ◽  
Scanning Electron ◽  
Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

Pengaruh implantasi ion tin (Titanium Nitrida) terhadap sifat mekanis baja VCL 140

2010 ◽  
Vol 8 (1) ◽  
pp. 753
Author(s):  
Muhammad Muhammad
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive Spectroscopy ◽  
Energy Dispersive ◽  
Scanning Electron

Implantasi ion dapat meningkatkan sifat mekanik seperti kekerasan bahan yang akan digunakan untuk komponen dan peralatan proses manufaktur. Implantasi ion dipengaruhi oleh jenis ion dopan, waktu dan energi yang digunakan. Penelitian ini dilakukan untuk mengetahui pengaruh energi dan waktu implantasi ion titanium nitrida terhadap kekerasan dan struktur mikro pada baja VCL 140. Implantasi dilakukan pada arus berkas tetap 10 yA. Variasi waktu 60, 70, 80, 90, 100, 110, 120 menit, energi 75 keV dan variasi energi 15, 30, 45, 60, 75, 90 dan 100 keV dengan waktu implantasi 100 menit dilakukan untuk mendapatkan kekerasan optimum. Uji Kekerasan menggunakan metode Vickers dengan beban 10 gram dan waktu 10 detik. Topografi dari lapisan TIN diamati menggunakan scanning electron microscopy (SEM) dan komposisi kimia dari lapisan TIN dianalisa menggunakan energy dispersive spectroscopy (EDS).Kata kunci : Implantasi ion, VCL 140, kekerasan

Structural Characterization of Gallbladder Stones Using Energy Dispersive X-ray Spectroscopy and X-ray Diffraction

2018 ◽  
Vol 21 (7) ◽  
pp. 495-500 ◽  
Author(s):  
Hassan A. Almarshad ◽  
Sayed M. Badawy ◽  
Abdalkarem F. Alsharari
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive ◽  
Spectroscopic Techniques ◽  
X Ray Diffraction ◽  
Major Health Problem ◽  
X Ray ◽  
Gallbladder Stones ◽  
Pure Cholesterol ◽  
Scanning Electron

Aim and Objective: Formation of the gallbladder stones is a common disease and a major health problem. The present study aimed to identify the structures of the most common types of gallbladder stones using X-ray spectroscopic techniques, which provide information about the process of stone formation. Material and Method: Phase and elemental compositions of pure cholesterol and mixed gallstones removed from gallbladders of patients were studied using energy-dispersive X-ray spectroscopy combined with scanning electron microscopy analysis and X-ray diffraction. Results: The crystal structures of gallstones which coincide with standard patterns were confirmed by X-ray diffraction. Plate-like cholesterol crystals with laminar shaped and thin layered structures were clearly observed for gallstone of pure cholesterol by scanning electron microscopy; it also revealed different morphologies from mixed cholesterol stones. Elemental analysis of pure cholesterol and mixed gallstones using energy-dispersive X-ray spectroscopy confirmed the different formation processes of the different types of gallstones. Conclusion: The method of fast and reliable X-ray spectroscopic techniques has numerous advantages over the traditional chemical analysis and other analytical techniques. The results also revealed that the X-ray spectroscopy technique is a promising technique that can aid in understanding the pathogenesis of gallstone disease.

Scanning Electron Microscopy Coupled with Energy Dispersive Spectrometric Analysis Reveals for the First Time Weddellite and Sylvite Crystals on the Surface of Involucral Bracts and Petals of two Xeranthemum L. (Compositae) Species

2017 ◽  
Vol 23 (3) ◽  
pp. 679-686 ◽  
Author(s):  
Milan Gavrilović ◽  
Suzana Erić ◽  
Petar D. Marin ◽  
Núria Garcia-Jacas ◽  
Alfonso Susanna ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Glandular Trichomes ◽  
Energy Dispersive ◽  
Spectrometric Analysis ◽  
Eds Analysis ◽  
Taxonomic Studies ◽  
First Time ◽  
Tetragonal Bipyramid ◽  
Scanning Electron

AbstractIn this work, weddellite and sylvite crystals are identified for the first time on the involucral bracts and petals of Xeranthemum annuum and Xeranthemum cylindraceum using scanning electron microscopy coupled with energy dispersive spectrometric (SEM-EDS) analysis. Well-developed crystals of weddellite (CaC2O4·2H2O) occur in the form of a tetragonal bipyramid (hhl), rarely in combination of a bipyramid and tetragonal prism (h00). Indumentum of involucral bracts of X. cylindraceum consists of nonglandular and glandular trichomes. Sylvite (KCl) crystals are observed only on the petal surface of X. cylindraceum. The crystals of sylvite occur in the form of perfect cubes (hexahedrons), but some crystals are deformed, i.e., partially elongated. Taxonomic significance of investigated microcharacters as well as the use of SEM-EDS analysis in taxonomic studies of plants are discussed.

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