Investigation of the early mineralisation on collagen in dentine of rat incisors by quantitative electron spectroscopic diffraction (ESD)

1994 ◽  
Vol 278 (3) ◽  
pp. 543-547
Author(s):  
Ulrich Plate ◽  
Siegfried Arnold ◽  
Ludwig Reimer ◽  
Hans-J�rgen H�hling ◽  
Alan Boyde
Author(s):  
J. Mayer

With imaging energy filters becoming commercially available in transmission electron microscopy many of the limitations of conventional TEM instruments can be overcome. Energy filtered images of diffraction patterns can now be recorded without scanning using efficient parallel (2-dimensional detection. We have evaluated a prototype of the Zeiss EM 912 Omega, the first commercially available electron microscope with integrated imaging Omega energy filter. Combining the capabilities of the imaging spectrometer with the principal operation modes of a TEM gives access to many new qualitative and quantitative techniques in electron microscopy. The basis for all of them is that the filter selecte electrons within a certain energy loss range ΔE1 <ΔE < ΔE2 and images their contribution to an image (electron spectroscopic imaging, ESI) or a diffraction pattern (electron spectroscopic diffraction, ESD) In many applications the filter is only used to remove the inelastically scattered electrons (elastic or zero loss filtering). Furthermore, the electron energy loss spectrum can be magnified and recorded with serial or parallel detection.


Author(s):  
R.H. Barckhaus ◽  
I. Fromm ◽  
H.J. Höhling ◽  
L. Reimer

Different stages in the mineralization of calcified tissues can be investigated by electron diffraction. A disadvantage is the strong background below the Debye—Scherrer rings caused by the large massthickness of calcified products and the high ratio (≃ 3) of the inelastic—to—elastic scattering cross—sections of the embedding material. Therefore, a large fraction of the background consists of inelastically scattered electrons with energy losses. The electron spectroscopic diffraction (ESD) mode of an energy—filtering microscope (ZEISS EM902) allows to record diffraction patterns using only the zero—loss electrons which consist of the primary beam, Bragg diffracted electrons and a smaller fraction of elastically scattered electrons between the Debye—Scherrer rings by thermal—diffuse scattering. Small—area diffraction patterns with different camera lengths are generated at the filter—entrance plane and the zero—loss electrons are selected by a slit in the energy—dispersive plane behind the Castaing—Henry filter lens.


Author(s):  
L. Reimer ◽  
I. Fromm

An electron diffraction pattern (EDP) consists of an overlap of patterns of all energy losses in the electron energy-loss spectrum (EELS). Electron spectroscopic diffraction (ESD) in an energy filtering electron microscope (EFEM) allows to separate the contributions of different energy losses to the unfiltered diagram observed in conventional TEM. We report about diffraction experiments with a Zeiss EM902 on (111) silicon foils which show how the EDP of single-crystal foils changes with increasing energy loss and foil thickness. An EDP normally contains the Bragg spots, diffuse streaks by electron-phonon scattering, excess and defect Kikuchi lines when the number of electrons striking the lattice planes is different from opposite sites, a system of excess (bright) Kikuchi bands with an intensity proportional to the probability ψψ⋆ of the Bloch wave field at the nuclei, and defect Ki-kuchi bands when the number of diffusely scattered electrons is equal on both sides of the lattice plane and the intensity becomes proportional to ΣIg.EDPs of thin foils show an increase of contrast of the Bragg spots and the thermal diffuse streaks when comparing an unfiltered (Fig.1a) and zero-loss filtered EDP (Fig.1b). Because the streaks are caused by elastic scattering, they can not be ob served with the plasmon loss (Fig.1c). Bragg spots are also observed at higher energy losses because all delocalized inelastic scattering processes with energy losses less a few hundred eV show intraband transitions which preserve the type of excited Bloch waves.


1997 ◽  
Vol 288 (1) ◽  
pp. 185-190 ◽  
Author(s):  
Siegfried Arnold ◽  
Ulrich Plate ◽  
Hans-Peter Wiesmann ◽  
Helmut Kohl ◽  
Hans-J�rgen H�hling

1994 ◽  
Vol 278 (3) ◽  
pp. 543-547 ◽  
Author(s):  
Ulrich Plate ◽  
Siegfried Arnold ◽  
Ludwig Reimer ◽  
Hans-J�rgen H�hling ◽  
Alan Boyde

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