Surface structure of silica gel reacted with 3-mercaptopropyltriethoxysilane and 3-aminopropyltriethoxysilane: formation of the S-S bridge structure and its characterization by Raman scattering and diffuse reflectance Fourier transform spectroscopic studies

2002 ◽  
Vol 280 (2) ◽  
pp. 135-145 ◽  
Author(s):  
H. Okabayashi ◽  
K. Izawa ◽  
T. Yamamoto ◽  
H. Masuda ◽  
E. Nishio ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Raman Scattering ◽  
Surface Structure ◽  
Silica Gel ◽  
Diffuse Reflectance ◽  
Spectroscopic Studies ◽  
Bridge Structure

Nondestructive Adhesive Analysis on Stamps by Fourier Transform Infrared Spectroscopy

1988 ◽  
Vol 42 (8) ◽  
pp. 1466-1469 ◽  
Author(s):  
Matthew Poslusny ◽  
Kenneth E. Daugherty
Keyword(s):  
Fourier Transform ◽  
Infrared Spectroscopy ◽  
Diffuse Reflectance ◽  
Fourier Transform Infrared ◽  
Spectroscopic Studies ◽  
Great Promise ◽  
Nondestructive Technique ◽  
The Subject ◽  
Popular Subject ◽  
Infrared Techniques

Spectroscopy has long been a popular subject with respect to postal stamps, but analysis of postal stamps has been the subject of only a few spectroscopic studies. Fourier transform infrared techniques were used in developing a nondestructive technique to analyze the adhesives on the back of stamps. This factor is of importance since the value of a stamp is partially dependent on the conditions of the original adhesive. Diffuse reflectance was finally settled on as the method of choice for this analysis, and it shows great promise not only for stamp analysis but also for other types of documentation analysis as well.

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