A new detector system for the structure powder diffractometer SPODI at the FRM-II in Garching

2002 ◽  
Vol 74 (0) ◽  
pp. s154-s156
Author(s):  
B. Krimmer ◽  
R. Gilles ◽  
K. Zeitelhack ◽  
R. Schneider ◽  
G. Montermann ◽  
...  
Keyword(s):  
Detector System ◽  
Powder Diffractometer

The New Neutron Powder Diffractometer with a Multi-Detector System for High-Efficiency and High-Resolution Measurements

1998 ◽  
Vol 37 (Part 1, No. 6A) ◽  
pp. 3319-3326 ◽  
Author(s):  
Kenji Ohoyama ◽  
Tomonori Kanouchi ◽  
Keiji Nemoto ◽  
Masayoshi Ohashi ◽  
Tsuyoshi Kajitani ◽  
...  
Keyword(s):  
High Resolution ◽  
High Efficiency ◽  
Detector System ◽  
Powder Diffractometer ◽  
Neutron Powder Diffractometer

A Noval X-ray powder Diffractometer Detector System

1976 ◽  
Vol 20 ◽  
pp. 529-545 ◽  
Author(s):  
Susan K. Byram ◽  
Bui Han ◽  
G. B. Rothbart ◽  
Roger N. Samdahl ◽  
Robert A. Sparks
Keyword(s):  
Proportional Counter ◽  
Angular Resolution ◽  
Small Sample ◽  
Detector System ◽  
Diffraction Spectrum ◽  
Powder Spectrum ◽  
Good Efficiency ◽  
X Ray ◽  
Preliminary Results ◽  
Powder Diffractometer

A new proportional counter x-ray detector with application for powder diffractometry has been developed. The new detector collects virtually the entire diffraction spectrum simultaneously with good efficiency and angular resolution. Thus, the powder spectrum of a small sample can be obtained much faster than with film or a conventional powder diffractometer. The detector read-out is digital and is interfaced to a dedicated minicomputer. A description of the detector system is discussed and preliminary results are presented.

A Novel X-ray Powder Diffractometer Detector System

1977 ◽  
pp. 529-545 ◽  
Author(s):  
Susan K. Byram ◽  
Bui Han ◽  
G. B. Rothbart ◽  
Roger N. Samdahl ◽  
Robert A. Sparks
Keyword(s):  
Detector System ◽  
X Ray ◽  
Powder Diffractometer

Imaging and diffraction modes in Scanning Transmission Electron Microscopy

1986 ◽  
Vol 44 ◽  
pp. 684-687
Author(s):  
J. M. Cowley ◽  
R. Glaisher ◽  
J. A. Lin ◽  
H.-J. Ou
Keyword(s):  
Scanning Transmission Electron Microscopy ◽  
High Efficiency ◽  
Fiber Optic ◽  
Image Intensifier ◽  
Detector System ◽  
Detector Plane ◽  
Secondary Electrons ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Special Detector

Some of the most important applications of STEM depend on the variety of imaging and diffraction made possible by the versatility of the detector system and the serial nature, of the image acquisition. A special detector system, previously described, has been added to our STEM instrument to allow us to take full advantage of this versatility. In this, the diffraction pattern in the detector plane may be formed on either of two phosphor screens, one with P47 (very fast) phosphor and the other with P20 (high efficiency) phosphor. The light from the phosphor is conveyed through a fiber-optic rod to an image intensifier and TV system and may be photographed, recorded on videotape, or stored digitally on a frame store. The P47 screen has a hole through it to allow electrons to enter a Gatan EELS spectrometer. Recently a modified SEM detector has been added so that high resolution (10Å) imaging with secondary electrons may be used in conjunction with other modes.

A New Detector System For The HB5 Stem Instrument

1985 ◽  
Vol 43 ◽  
pp. 134-135
Author(s):  
J.M. Cowley
Keyword(s):  
Dark Field ◽  
Detector System ◽  
Electron Holography ◽  
Small Specimen ◽  
Bright Field ◽  
Multiple Images ◽  
Practical Applications ◽  
Wide Range ◽  
Diffraction Patterns ◽  
Operational Modes

The HB5 STEM instrument at ASU has been modified previously to include an efficient two-dimensional detector incorporating an optical analyser device and also a digital system for the recording of multiple images. The detector system was built to explore a wide range of possibilities including in-line electron holography, the observation and recording of diffraction patterns from very small specimen regions (having diameters as small as 3Å) and the formation of both bright field and dark field images by detection of various portions of the diffraction pattern. Experience in the use of this system has shown that sane of its capabilities are unique and valuable. For other purposes it appears that, while the principles of the operational modes may be verified, the practical applications are limited by the details of the initial design.

scholarly journals Development of a synchrotron powder diffractometer with a one-dimensional X-ray detector for analysis of advanced materials

2013 ◽  
Vol 121 (1411) ◽  
pp. 287-290 ◽  
Author(s):  
Masahiko TANAKA ◽  
Yoshio KATSUYA ◽  
Yoshitaka MATSUSHITA ◽  
Osami SAKATA
Keyword(s):  
Advanced Materials ◽  
One Dimensional ◽  
X Ray ◽  
Powder Diffractometer
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