Local electronic structure at steps on Au(111) investigated by the thermovoltage in scanning tunneling microscopy

1998 ◽  
Vol 66 (7) ◽  
pp. S161-S165 ◽  
Author(s):  
A. Schneider ◽  
M. Wenderoth ◽  
K.J. Engel ◽  
M.A. Rosentreter ◽  
A.J. Heinrich ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Local Electronic Structure

Local Electronic Structure in Ordered Aggregates of Carbon Nanotubes: Scanning Tunneling Microscopy/scanning Tunneling Spectroscopy Study

1998 ◽  
Vol 13 (9) ◽  
pp. 2389-2395 ◽  
Author(s):  
D. L. Carroll ◽  
P. M. Ajayan ◽  
S. Curran
Keyword(s):  
Carbon Nanotubes ◽  
Electronic Structure ◽  
Scanning Tunneling Microscopy ◽  
Local Density ◽  
Scanning Tunneling Spectroscopy ◽  
Tunneling Spectroscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Spatially Resolved ◽  
Local Electronic Structure

The recent application of tunneling probes in electronic structure studies of carbon nanotubes has proven both powerful and challenging. Using scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS), local electronic properties in ordered aggregates of carbon nanotubes (multiwalled nanotubes and ropes of single walled nanotubes) have been probed. In this report, we present evidence for interlayer (concentric tube) interactions in multiwalled tubes and tube-tube interactions in singlewalled nanotube ropes. The spatially resolved, local electronic structure, as determined by the local density of electronic states, is shown to clearly reflect tube-tube interactions in both of these aggregate forms.

scholarly journals Surface defects and their impact on the electronic structure of Mo-doped CaO films: an STM and DFT study

2014 ◽  
Vol 16 (25) ◽  
pp. 12764-12772 ◽  
Author(s):  
Yi Cui ◽  
Xiang Shao ◽  
Stefano Prada ◽  
Livia Giordano ◽  
Gianfranco Pacchioni ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Dft Calculations ◽  
Scanning Tunneling Microscopy ◽  
Surface Defects ◽  
Dft Study ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Local Electronic Structure

Scanning tunneling microscopy and DFT calculations are used to probe the local electronic structure of a Mo-doped CaO film.

Probing nucleation and growth phenomena on silicon surfaces by scanning tunneling microscopy/spectroscopy

1989 ◽  
Vol 47 ◽  
pp. 28-29
Author(s):  
R.J. Hamers ◽  
U.K. Kohler ◽  
K. Markert ◽  
J.E. Demuth
Keyword(s):  
Electronic Structure ◽  
Scanning Tunneling Microscopy ◽  
Chemical Reactivity ◽  
Real Space ◽  
Nucleation And Growth ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Surface Geometry ◽  
Local Electronic Structure

Nucleation and growth processes have long been studied using diffraction technique On semiconductor surfaces, localized defects strongly affect both the electron properties of the surfaces as well as their reactivity, therby affecting nucleat and growth. In order to identify the role of local electronic structure, and surface irregularities such as steps and defects, a real-space probe of electronic structure is needed. Scanning tunneling microscopy is capable of probing both the local surface geometry and local electronic structure, permitting adsorption and chemical reactivity to be studied on an atom-by-atom basis.

Nanometer Scale Structures Resulting from Graphite Oxidation

1994 ◽  
Vol 332 ◽  
Author(s):  
Marilyn J. Nowakowski ◽  
John M. Vohs ◽  
Dawn A. Bonnell
Keyword(s):  
Electronic Structure ◽  
Scanning Tunneling Microscopy ◽  
Oxygen Plasma ◽  
Pyrolytic Graphite ◽  
Scanning Tunneling ◽  
Nanometer Scale ◽  
Tunneling Microscopy ◽  
Graphite Oxidation ◽  
Local Electronic Structure ◽  
Scale Structures

ABSTRACTScanning tunneling microscopy (STM) and spectroscopy (STS) were used to characterize highly oriented pyrolytic graphite (HOPG) which was oxidized by two different methods, furnace heating in atmosphere and immersion in oxygen plasma. The character of the surfaces was found to be dissimilar on a micron scale but comparable on a nanometer scale, at which both appear to be comprised of sharp step edges. Variations in local electronic structure near a step edge were compared.

Room temperature observation of the correlation between atomic and electronic structure of graphene on Cu(110)

RSC Advances ◽  
2016 ◽  
Vol 6 (100) ◽  
pp. 98001-98009 ◽  
Author(s):  
Thais Chagas ◽  
Thiago H. R. Cunha ◽  
Matheus J. S. Matos ◽  
Diogo D. dos Reis ◽  
Karolline A. S. Araujo ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Chemical Vapor Deposition ◽  
Scanning Tunneling Microscopy ◽  
Vapor Deposition ◽  
Room Temperature ◽  
Chemical Vapor ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Temperature Observation ◽  
Atomic And Electronic Structure

We have used atomically-resolved scanning tunneling microscopy and spectroscopy to study the interplay between the atomic and electronic structure of graphene formed on copper via chemical vapor deposition.

Morphology and electronic structure of Gd wires studied with scanning tunneling microscopy

1998 ◽  
Vol 66 (7) ◽  
pp. S1195-S1198 ◽  
Author(s):  
A. Mühlig ◽  
T. Günther ◽  
A. Bauer ◽  
K. Starke ◽  
B.L. Petersen ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

STM/STS investigation of carbon nanotubes deposited on Bi2Te3 surface

Open Physics ◽  
2009 ◽  
Vol 7 (2) ◽  
Author(s):  
Maciej Bazarnik ◽  
Maciej Cegiel ◽  
Piotr Biskupski ◽  
Monika Jazdzewska ◽  
SÅ‚awomir Mielcarek ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electronic Structure ◽  
Scanning Tunneling Microscopy ◽  
Structural Defects ◽  
Scanning Tunneling ◽  
Narrow Gap ◽  
Tunneling Microscopy ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes ◽  
Walled Cnts

AbstractThis paper reports our scanning tunneling microscopy and spectroscopy (STM/STS) study of double-walled and multi-walled carbon nanotubes (CNTs) of different diameter deposited on Bi2Te3 (narrow gap semiconductor). The approximate diameter of the studied double-walled and multi-walled CNTs was 2 nm and 8 nm, respectively. Crystalline Bi2Te3 was used as a substrate to enhance the contrast between the CNTs and the substrate in the STS measurements performed to examine peculiarities of CNT morphology, such as junctions, ends or structural defects, in terms of their electronic structure.

Sign in / Sign up

Export Citation Format

Share Document