Defects and voids in He + -implanted Si studied by slow-positron annihilation and transmission electron microscopy
1997 ◽
Vol 255-257
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pp. 572-574
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1994 ◽
Vol 69
(3)
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pp. 551-563
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1998 ◽
Vol 186
(3)
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pp. 323-342
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1980 ◽
Vol 41
(2)
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pp. 145-156
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2011 ◽
Vol 465
◽
pp. 199-202
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2016 ◽
Vol 47
(12)
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pp. 6384-6393
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1992 ◽
Vol 27
(8)
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pp. 1049-1054
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2009 ◽
Vol 89
(13)
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pp. 1095-1110
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