Temperature dependent inelastic X-ray scattering of synchrotron radiation on myoglobin analyzed by the Mössbauer effect

1996 ◽  
Vol 25 (1) ◽  
pp. 43-46 ◽  
Author(s):  
K. Achterhold ◽  
C. Keppler ◽  
U. van Bürck ◽  
W. Potzel ◽  
P. Schindelmann ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Mössbauer Effect ◽  
Mossbauer Effect ◽  
Temperature Dependent ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

Temperature-dependent small-angle x-ray scattering from poly(vinylidene fluoride)

1980 ◽  
Vol 51 (10) ◽  
pp. 5508 ◽  
Author(s):  
J. M. Schultz ◽  
J. S. Lin ◽  
R. W. Hendricks ◽  
R. R. Lagasse ◽  
R. G. Kepler
Keyword(s):  
Small Angle ◽  
Vinylidene Fluoride ◽  
Temperature Dependent ◽  
X Ray ◽  
X Ray Scattering ◽  
Poly Vinylidene Fluoride ◽  
Ray Scattering

Diffuse x-ray scattering from InGaAs/GaAs quantum dots

2003 ◽  
Vol 799 ◽  
Author(s):  
Rolf Köhler ◽  
Daniil Grigoriev ◽  
Michael Hanke ◽  
Martin Schmidbauer ◽  
Peter Schäfer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Synchrotron Radiation ◽  
Diffuse Scattering ◽  
Data Evaluation ◽  
X Ray ◽  
X Ray Scattering ◽  
Gaas Matrix ◽  
Wetting Layers ◽  
Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

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