Investigations on the use of chemical modifiers for the direct determination of trace impurities in Al 2 O 3 ceramic powders by slurry electrothermal evaporation coupled with inductively-coupled plasma mass spectrometry (ETV-ICP-MS)

2001 ◽  
Vol 370 (5) ◽  
pp. 513-520 ◽  
Author(s):  
M. C. Wende ◽  
J. A. C. Broekaert
Sign in / Sign up

Export Citation Format

Share Document