Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique

1999 ◽  
Vol 364 (6) ◽  
pp. 551-555 ◽  
Author(s):  
Tianyou Peng ◽  
Zucheng Jiang ◽  
Bin Hu ◽  
Zhenghuan Liao
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