Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique
1999 ◽
Vol 364
(6)
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pp. 551-555
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1994 ◽
Vol 296
(2)
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pp. 213-218
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1991 ◽
Vol 6
(8)
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pp. 623-626
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2000 ◽
Vol 367
(3)
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pp. 259-263
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2009 ◽
Vol 63
(12)
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pp. 1403-1406
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2001 ◽
Vol 433
(2)
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pp. 255-262
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