Trace analysis of high-purity copper by total reflection X-ray fluorescence spectrometry

1998 ◽  
Vol 362 (4) ◽  
pp. 395-398 ◽  
Author(s):  
Hitoshi Yamaguchi ◽  
Sinji Itoh ◽  
Shukuro Igarashi ◽  
Kunishige Naitoh ◽  
Ryosuke Hasegawa
Keyword(s):  
High Purity ◽  
Trace Analysis ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Purity Copper

Trace analysis of high-purity iron by total reflection X-ray fluorescence spectrometry

1990 ◽  
Vol 338 (8) ◽  
pp. 891-894 ◽  
Author(s):  
J. S. Chen ◽  
H. Berndt ◽  
R. Klockenk�mper ◽  
G. T�lg
Keyword(s):  
High Purity ◽  
Trace Analysis ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Purity Iron ◽  
High Purity Iron

Direct determination of fluorine in high-purity water samples using vacuum sample chamber total reflection X-ray fluorescence spectrometry

2018 ◽  
Vol 33 (5) ◽  
pp. 876-882 ◽  
Author(s):  
Kaushik Sanyal ◽  
N. L. Misra
Keyword(s):  
High Purity ◽  
Water Samples ◽  
Vacuum Chamber ◽  
Direct Determination ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Sample Chamber

Trace levels of F in high-purity water samples were determined using vacuum chamber total reflection X-ray fluorescence spectrometry.

The quantification of total lead in lipstick specimens by total reflection X-ray fluorescence spectrometry

2015 ◽  
Vol 44 (6) ◽  
pp. 451-457 ◽  
Author(s):  
Eric DaSilva ◽  
Alison Matthews David ◽  
Ana Pejović-Milić
Keyword(s):  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray

scholarly journals Trace Metals in Microcrustaceans and Brazilian Waterweed from a Contaminated Chilean Wetland Using Total Reflection X-Ray Fluorescence Spectrometry

2006 ◽  
Vol 154 (3-4) ◽  
pp. 261-268 ◽  
Author(s):  
Stefan Woelfl ◽  
Margarete Mages ◽  
Francisco Encina ◽  
Francisco Bravo
Keyword(s):  
Trace Metals ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray

Bulk determination of uranium and thorium in presence of each other by Total Reflection X-ray Fluorescence spectrometry

2007 ◽  
Vol 62 (1) ◽  
pp. 82-85 ◽  
Author(s):  
Sangita Dhara ◽  
Nand Lal Misra ◽  
Khush Dev Singh Mudher ◽  
Suresh Kumar Aggarwal
Keyword(s):  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray
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