scholarly journals Tracking a person with pre-recorded image database and a pan, tilt, and zoom camera

2000 ◽  
Vol 12 (1) ◽  
pp. 32-43 ◽  
Author(s):  
Yiming Ye ◽  
John K. Tsotsos ◽  
Eric Harley ◽  
Karen Bennet
Keyword(s):  
Image Database ◽  
Recorded Image

Quanitative aspects of electron diffraction using electron holography

1995 ◽  
Vol 53 ◽  
pp. 616-617
Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Software Package ◽  
Spatial Coherence ◽  
Electron Holography ◽  
Image Intensity ◽  
Interference Fringes ◽  
Complex Image ◽  
The Difference ◽  
Recorded Image

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.

Computer-Controlled Hrem Alignment Using Automated Diffractogram Analysis

1990 ◽  
Vol 48 (1) ◽  
pp. 532-533
Author(s):  
G.Y. Fan ◽  
O.L. Krivanek
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
The Other ◽  
Full Information ◽  
Resolution Electron ◽  
Skilled Operator ◽  
Automatic Alignment ◽  
High Resolution Electron Microscope ◽  
Computer Controlled ◽  
Recorded Image

Full alignment of a high resolution electron microscope (HREM) requires five parameters to be optimized: the illumination angle (beam tilt) x and y, defocus, and astigmatism magnitude and orientation. Because neither voltage nor current centering lead to the correct illumination angle, all the adjustments must be done on the basis of observing contrast changes in a recorded image. The full alignment can be carried out by a computer which is connected to a suitable image pick-up device and is able to control the microscope, sometimes with greater precision and speed than even a skilled operator can achieve. Two approaches to computer-controlled (automatic) alignment have been investigated. The first is based on measuring the dependence of the overall contrast in the image of a thin amorphous specimen on the relevant parameters, the other on measuring the image shift. Here we report on our progress in developing a new method, which makes use of the full information contained in a computed diffractogram.

The Image Database Management System of Teaching File Using Personal Computer

1995 ◽  
Vol 32 (4) ◽  
pp. 677
Author(s):  
M J Shin ◽  
G W Kim ◽  
T J Chun ◽  
W H Ahn ◽  
S K Balk ◽  
...  
Keyword(s):  
Personal Computer ◽  
Management System ◽  
Database Management ◽  
Image Database ◽  
Database Management System ◽  
Teaching File

scholarly journals CASIA-Face-Africa: A Large-scale African Face Image Database

2021 ◽  
pp. 1-1
Author(s):  
Jawad Muhammad ◽  
Yunlong Wang ◽  
Caiyong Wanga ◽  
Kunbo Zhang ◽  
Zhenan Sun
Keyword(s):  
Large Scale ◽  
Image Database ◽  
Face Image

Image database retrieval utilizing affinity relationships

2003 ◽  
Author(s):  
Mei-Ling Shyu ◽  
Shu-Ching Chen ◽  
Min Chen ◽  
Chengcui Zhang ◽  
Kanoksri Sarinnapakorn
Keyword(s):  
Image Database ◽  
Database Retrieval
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