Plastic deformation of metamorphic pyrite: new evidence from electron-backscatter diffraction and forescatter orientation-contrast imaging

1998 ◽  
Vol 34 (1) ◽  
pp. 71-81 ◽  
Author(s):  
A. P. Boyle ◽  
D. J. Prior ◽  
M. H. Banham ◽  
N. E. Timms
Keyword(s):  
Plastic Deformation ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Orientation Contrast ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
New Evidence

The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

1999 ◽  
Vol 84 (11-12) ◽  
pp. 1741-1759 ◽  
Author(s):  
David J. Prior ◽  
Alan P. Boyle ◽  
Frank Brenker ◽  
Michael C. Cheadle ◽  
Austin Day ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Orientation Contrast ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data

Symmetry ◽  
2020 ◽  
Vol 12 (4) ◽  
pp. 677
Author(s):  
Alexander Smirnov ◽  
Evgeniya Smirnova ◽  
Sergey Alexandrov
Keyword(s):  
Plastic Deformation ◽  
Electron Backscatter Diffraction ◽  
Thin Layers ◽  
New Method ◽  
Metallic Materials ◽  
Surface Layers ◽  
Kernel Average Misorientation ◽  
Electron Backscatter ◽  
Properties Of Materials ◽  
Backscatter Diffraction

It is, in general, essential to investigate correlations between the microstructure and properties of materials. Plastic deformation often localizes within thin layers. As a result, many material properties within such layers are very different from the properties in bulk. The present paper proposes a new method for determining the thickness of a thin surface layer of intensive plastic deformation in metallic materials. For various types of materials, such layers are often generated near frictional interfaces. The method is based on data obtained by Electron Backscatter Diffraction. The results obtained are compared with those obtained by an alternative method based on microhardness measurements. The new method allows for determining the layer thickness of several microns in specimens after grinding. In contrast, the measurement of microhardness does not reveal the presence of this layer. The grain-based and kernel-based types of algorithms are also adopted for determining the thickness of the layer. Data processed by the strain contouring and kernel average misorientation algorithms are given to illustrate this method. It is shown that these algorithms do not clearly detect the boundary between the layer of intensive plastic deformation and the bulk. As a result, these algorithms are unable to determine the thickness of the layer with high accuracy.

scholarly journals Novel −75°C SEM cooling stage: application for martensitic transformation in steel

Microscopy ◽  
2020 ◽  
Author(s):  
Kaneaki Tsuzazki ◽  
Motomichi Koyama ◽  
Ryosuke Sasaki ◽  
Keiichiro Nakafuji ◽  
Kazushi Oie ◽  
...  
Keyword(s):  
Martensitic Transformation ◽  
Electron Backscatter Diffraction ◽  
Dislocation Slip ◽  
In Situ Observation ◽  
Contrast Imaging ◽  
Cooling Stage ◽  
Electron Channelling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Abstract Microstructural changes during the martensitic transformation from face-centred cubic (FCC) to body-centred cubic (BCC) in an Fe-31Ni alloy were observed by scanning electron microscopy (SEM) with a newly developed Peltier stage available at temperatures to  −75°C. Electron channelling contrast imaging (ECCI) was utilized for the in situ observation during cooling. Electron backscatter diffraction analysis at ambient temperature (20°C) after the transformation was performed for the crystallographic characterization. A uniform dislocation slip in the FCC matrix associated with the transformation was detected at −57°C. Gradual growth of a BCC martensite was recognized upon cooling from −57°C to −63°C.

Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

2012 ◽  
Vol 18 (S2) ◽  
pp. 702-703 ◽  
Author(s):  
J.R. Seal ◽  
T. Bieler ◽  
M. Crimp ◽  
B. Britton ◽  
A. Wilkinson
Keyword(s):  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Pure Titanium ◽  
Commercially Pure Titanium ◽  
Contrast Imaging ◽  
Commercially Pure ◽  
Slip Transfer ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

2006 ◽  
Vol 22 (11) ◽  
pp. 1352-1358 ◽  
Author(s):  
C. Trager-Cowan ◽  
F. Sweeney ◽  
A. Winkelmann ◽  
A. J. Wilkinson ◽  
P. W. Trimby ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Electron Channelling ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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