A Novel Micro-Structured Reference Material for Ion and X-Ray Microbeam Analysis

2000 ◽  
Vol 132 (2-4) ◽  
pp. 521-525
Author(s):  
Uwe Wätjen ◽  
István Bársony ◽  
Csaba Dücsö
Keyword(s):  
Reference Material ◽  
X Ray ◽  
Microbeam Analysis

Lateral resolution of the electron microbeam analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 542-543
Author(s):  
H.J. Dudek
Keyword(s):  
Quantitative Analysis ◽  
Depth Resolution ◽  
Lateral Resolution ◽  
Cylindrical Particle ◽  
Correction Procedure ◽  
X Ray ◽  
Element Concentrations ◽  
Microbeam Analysis ◽  
The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

X-ray photoelectron spectroscopy studies of laterite standard reference material

2005 ◽  
Vol 228 (1-2) ◽  
pp. 151-162 ◽  
Author(s):  
J. Mendialdua ◽  
R. Casanova ◽  
F. Rueda ◽  
A. Rodríguez ◽  
J. Quiñones ◽  
...  
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Spectroscopy Studies

scholarly journals NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering

2017 ◽  
Vol 50 (2) ◽  
pp. 462-474 ◽  
Author(s):  
Andrew J. Allen ◽  
Fan Zhang ◽  
R. Joseph Kline ◽  
William F. Guthrie ◽  
Jan Ilavsky
Keyword(s):  
Reference Material ◽  
Small Angle ◽  
Standard Reference Material ◽  
Absolute Intensity ◽  
Calibration Standard ◽  
X Ray ◽  
X Ray Scattering ◽  
Nist Standard Reference Material ◽  
Intensity Calibration ◽  
Ray Scattering

The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra-small-angle X-ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certifiedQrange,Q= 0.008–0.25 Å−1, together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X-ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small-angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification.

D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material

2009 ◽  
Vol 24 (2) ◽  
pp. 171-171 ◽  
Author(s):  
D. Windover ◽  
D.L. Gil ◽  
A. Henins ◽  
J.P. Cline
Keyword(s):  
High Resolution ◽  
Reference Material ◽  
Standard Reference Material ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Synthesis, structural chemistry and antimicrobial activity of −(−) borneol derivative

2010 ◽  
Vol 8 (5) ◽  
pp. 1127-1133 ◽  
Author(s):  
Khalid Al-Farhan ◽  
Ismail Warad ◽  
Saud Al-Resayes ◽  
Moustafa Fouda ◽  
Mohamed Ghazzali
Keyword(s):  
Escherichia Coli ◽  
Antimicrobial Activity ◽  
Hydrogen Bonding ◽  
Reference Material ◽  
High Sensitivity ◽  
Structural Determinants ◽  
Single Crystal Diffraction ◽  
Methane Sulfonate ◽  
X Ray ◽  
Hirshfeld Surfaces

AbstractBorneol is a monoterpene that is a part of traditional Chinese and Japanese medicine. (−) borneol reacted with methanesulfonyl chloride in THF/pyridine to afford the new 1,7,7-trimethylbicyclo[2.2.1]hept-2-yl methane sulfonate derivative in excellent yield. The product is characterized by H1NMR, C13NMR, mass spectroscopy as well as elemental analysis and its structure was identified by X-ray single crystal diffraction. The packing of 1,7,7-trimethylbicyclo[2.2.1]hept-2-yl methanesulfonate exhibits the non-classical C-H···O hydrogen bonding in C(4) and R22(8) chain and ring motifs as structural determinants. This was also confirmed by the analysis of Hirshfeld surfaces. The 1,7,7-trimethylbicyclo[2.2.1]hept-2-yl methane sulfonate antimicrobial activity was tested and compared with its parent (−) borneol against three different pathogens. Particularly, 1,7,7-trimethylbicyclo[2.2.1]hept-2-yl methane sulfonate showed high sensitivity, compared to Chloramphenicol reference material, against Escherichia coli.

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