Stochastic models in the theory of phase transitions

Author(s):  
B. Ubbo Felderhof
1995 ◽  
Vol 32 (01) ◽  
pp. 193-201
Author(s):  
Shui Feng

A class of non-linear stochastic models is introduced. Phase transitions, critical points and the domain of attraction are discussed in detail for some concrete examples. For one of the examples the explicit expression for the domain of attraction and the rates of convergence are obtained.


1995 ◽  
Vol 32 (1) ◽  
pp. 193-201
Author(s):  
Shui Feng

A class of non-linear stochastic models is introduced. Phase transitions, critical points and the domain of attraction are discussed in detail for some concrete examples. For one of the examples the explicit expression for the domain of attraction and the rates of convergence are obtained.


Author(s):  
G. Timp ◽  
L. Salamanca-Riba ◽  
L.W. Hobbs ◽  
G. Dresselhaus ◽  
M.S. Dresselhaus

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.


Author(s):  
Oleg Bostanjoglo ◽  
Peter Thomsen-Schmidt

Thin GexTe1-x (x = 0.15-0.8) were studied as a model substance of a composite semiconductor film, in addition being of interest for optical storage material. Two complementary modes of time-resolved TEM were used to trace the phase transitions, induced by an attached Q-switched (50 ns FWHM) and frequency doubled (532 nm) Nd:YAG laser. The laser radiation was focused onto the specimen within the TEM to a 20 μm spot (FWHM). Discrete intermediate states were visualized by short-exposure time doubleframe imaging /1,2/. The full history of a transformation was gained by tracking the electron image intensity with photomultiplier and storage oscilloscopes (space/time resolution 100 nm/3 ns) /3/. In order to avoid radiation damage by the probing electron beam to detector and specimen, the beam is pulsed in this continuous mode of time-resolved TEM,too.Short events ( <2 μs) are followed by illuminating with an extended single electron pulse (fig. 1c)


Author(s):  
Rohan Abeyaratne ◽  
James K. Knowles
Keyword(s):  

Author(s):  
Lorenza Saitta ◽  
Attilio Giordana ◽  
Antoine Cornuejols

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