Magneto-optic microscopy beyond the diffraction limit: Facts, trends, and dreams

2007 ◽  
pp. 531-540 ◽  
Author(s):  
Paul Fumagalli
Keyword(s):  
Diffraction Limit ◽  
Optic Microscopy ◽  
Magneto Optic

Scanning near-field magneto-optic microscopy using illuminated fiber tips

1998 ◽  
Vol 71 (1-4) ◽  
pp. 249-256 ◽  
Author(s):  
Georg Eggers ◽  
Andreas Rosenberger ◽  
Nicole Held ◽  
Ansgar Münnemann ◽  
Gernot Güntherodt ◽  
...  
Keyword(s):  
Near Field ◽  
Optic Microscopy ◽  
Magneto Optic

scholarly journals Extreme anti-reflection enhanced magneto-optic Kerr effect microscopy

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Dongha Kim ◽  
Young-Wan Oh ◽  
Jong Uk Kim ◽  
Soogil Lee ◽  
Arthur Baucour ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Kerr Effect ◽  
Domain Walls ◽  
State Of The Art ◽  
Magnetic Domain ◽  
Diffraction Limit ◽  
Scanning Probe ◽  
Spintronic Devices ◽  
Sub Wavelength ◽  
Magneto Optic

AbstractMagnetic and spintronic media have offered fundamental scientific subjects and technological applications. Magneto-optic Kerr effect (MOKE) microscopy provides the most accessible platform to study the dynamics of spins, magnetic quasi-particles, and domain walls. However, in the research of nanoscale spin textures and state-of-the-art spintronic devices, optical techniques are generally restricted by the extremely weak magneto-optical activity and diffraction limit. Highly sophisticated, expensive electron microscopy and scanning probe methods thus have come to the forefront. Here, we show that extreme anti-reflection (EAR) dramatically improves the performance and functionality of MOKE microscopy. For 1-nm-thin Co film, we demonstrate a Kerr amplitude as large as 20° and magnetic domain imaging visibility of 0.47. Especially, EAR-enhanced MOKE microscopy enables real-time detection and statistical analysis of sub-wavelength magnetic domain reversals. Furthermore, we exploit enhanced magneto-optic birefringence and demonstrate analyser-free MOKE microscopy. The EAR technique is promising for optical investigations and applications of nanomagnetic systems.

scholarly journals SCANNING NEAR-FIELD MAGNETO-OPTIC MICROSCOPY: QUANTITATIVE DETERMINATION OF FARADAY AND KERR EFFECTS

1998 ◽  
Vol 22 (S_2_MORIS_97) ◽  
pp. S2_27-30
Author(s):  
P. FUMAGALLI ◽  
G. EGGERS ◽  
A. ROSENBERGER ◽  
N. HELD ◽  
A. MÜNNEMANN
Keyword(s):  
Quantitative Determination ◽  
Near Field ◽  
Optic Microscopy ◽  
Magneto Optic

Quantitative determination of the local Kerr rotation by scanning near-field magneto-optic microscopy

1998 ◽  
Vol 72 (22) ◽  
pp. 2803-2805 ◽  
Author(s):  
P. Fumagalli ◽  
A. Rosenberger ◽  
G. Eggers ◽  
A. Münnemann ◽  
N. Held ◽  
...  
Keyword(s):  
Quantitative Determination ◽  
Near Field ◽  
Kerr Rotation ◽  
Optic Microscopy ◽  
Magneto Optic

Single-pulse magneto-optic microscopy: a new tool for studying optically induced magnetization reversals

2008 ◽  
Vol 33 (23) ◽  
pp. 2734 ◽  
Author(s):  
M. Elazar ◽  
M. Sahaf ◽  
L. Szapiro ◽  
D. Cheskis ◽  
S. Bar-Ad
Keyword(s):  
Single Pulse ◽  
Optic Microscopy ◽  
Magneto Optic ◽  
Optically Induced

Confocal Raman mapping

1992 ◽  
Vol 50 (2) ◽  
pp. 1514-1515
Author(s):  
J. Barbillat ◽  
M. Delhaye ◽  
P. Dhamelincourt
Keyword(s):  
Chemical Species ◽  
Diffraction Limit ◽  
Microscopic Level ◽  
Raman Mapping ◽  
Complete Spectrum ◽  
Laser Illumination ◽  
Ccd Detector ◽  
Raman Microprobe ◽  
Photodiode Array ◽  
Raman Image

Raman mapping, with a spatial resolution close to the diffraction limit, can help to reveal the distribution of chemical species at the surface of an heterogeneous sample.As early as 1975,three methods of sample laser illumination and detector configuration have been proposed to perform Raman mapping at the microscopic level (Fig. 1),:- Point illumination:The basic design of the instrument is a classical Raman microprobe equipped with a PM tube or either a linear photodiode array or a two-dimensional CCD detector. A laser beam is focused on a very small area ,close to the diffraction limit.In order to explore the whole surface of the sample,the specimen is moved sequentially beneath the microscope by means of a motorized XY stage. For each point analyzed, a complete spectrum is obtained from which spectral information of interest is extracted for Raman image reconstruction.- Line illuminationA narrow laser line is focused onto the sample either by a cylindrical lens or by a scanning device and is optically conjugated with the entrance slit of the stigmatic spectrograph.

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