How much can Auger electrons tell us about solid surfaces?

1975 ◽  
pp. 97-125 ◽  
Author(s):  
K. Müller
Keyword(s):  
Solid Surfaces ◽  
Auger Electrons

Apparatus for the Study of Ejection of Auger Electrons from Solid Surfaces

1963 ◽  
Vol 34 (5) ◽  
pp. 574-579 ◽  
Author(s):  
Frank Propst ◽  
Edgar Lüscher
Keyword(s):  
Solid Surfaces ◽  
Auger Electrons

Limits of AES microanalysis in SEM

1978 ◽  
Vol 36 (1) ◽  
pp. 522-523
Author(s):  
A. Delong ◽  
V. KolaŘÍk
Keyword(s):  
Electron Spectroscopy ◽  
Electron Probe ◽  
Auger Electron ◽  
High Current Density ◽  
Solid Surfaces ◽  
List Type ◽  
High Current ◽  
Auger Electrons ◽  
Secondary Electrons ◽  
Very High

Auger electron spectroscopy Is a well known method of chemical analysis of solid surfaces. For its application the following features are important:i) highest sensitivity when measuring small concetrationsii) smallest diameter of the analyzed areaIt is clear that these two requirements are contradictory. For many applications the second condition is predominant in spite of the fact that it is necessary to take into account the concentration of the element analyzed as high as nearly 100%. As the Auger electrons posses energies in the range of some tens to a few hundred eV, it can be supposed that the smallest surface area from which they can be generated due to scattering will not differ from the area involved in the emission of secondary electrons, i.e. it will not be larger than 100 Å.There are two other important conditions :i) the use of a very small electron probe (100 Å)ii) the attainment of very high current density in the probe

Adsorption-desorption processes on solid surfaces.

1983 ◽  
Vol 139 (4) ◽  
pp. 736
Author(s):  
V.N. Ageev ◽  
E.Ya. Zandberg ◽  
N.I. Ionov ◽  
A.Ya. Tontegode
Keyword(s):  
Solid Surfaces ◽  
Adsorption Desorption

Structural and Spectroscopic Study of Langmuir-Schäfer Films of Bis Zn-Ethane-Bridged Porphyrins Dimer

2003 ◽  
Vol 771 ◽  
Author(s):  
G. Panzera ◽  
S. Conoci ◽  
S. Coffa ◽  
B. Pignataro ◽  
S. Sortino ◽  
...  
Keyword(s):  
Surface Pressure ◽  
Scanning Force Microscopy ◽  
Structural Features ◽  
Solid Surfaces ◽  
Condensed Phases ◽  
Brewster Angle Microscopy ◽  
Force Microscopy ◽  
Vis Spectroscopy ◽  
Scanning Force ◽  
Supramolecular Aggregates

AbstractThin films (1-24 layers) of bis-zinc ethane-bridged porphyrin dimer (1) have been transferred on solid surfaces, by the Langmuir- Schäfer (LS) horizontal method. The related surface pressurearea isotherm curve shows that in dependence of the film pressure different condensed phases may occur in the monolayer. The inspection of the monolayer by Brewster Angle Microscopy (BAM) reveals the presence of peculiar networks whose structural features seemingly change upon film compression. On the other hand, the Scanning Force Microscopy (SFM) analysis performed on LS films shows fractal networks constituted by nanoscopic supramolecular aggregates, whose shape and size depend again on the LS deposition surface pressure. Finally, also UV-vis spectroscopy measurements indicates that the absorption is almost linearly related to the film thickness that is directly connected to the surface pressure.

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