Surgical probe design for a coincidence imaging system without a collimator

2005 ◽  
pp. 8-22 ◽  
Author(s):  
J R Saffer ◽  
H H Barrett ◽  
H B Barber ◽  
J M Woolfenden
Keyword(s):  
Imaging System ◽  
Probe Design ◽  
Coincidence Imaging

Surgical probe design for a coincidence imaging system without a collimator

1992 ◽  
Vol 10 (6) ◽  
pp. 333-341 ◽  
Author(s):  
J.R Saffer ◽  
H.H Barrett ◽  
H.B Barber ◽  
J.M Woolfenden
Keyword(s):  
Imaging System ◽  
Probe Design ◽  
Coincidence Imaging

Coincidence imaging system with electron optics

2011 ◽  
Vol 633 ◽  
pp. S270-S273 ◽  
Author(s):  
Martin Kroupa ◽  
Jan Jakubek ◽  
Frantisek Krejci ◽  
J. Zemlicka ◽  
M. Horacek ◽  
...  
Keyword(s):  
Imaging System ◽  
Electron Optics ◽  
Coincidence Imaging

Hot sphere detection limits for a dual head coincidence imaging system

1999 ◽  
Vol 46 (6) ◽  
pp. 2185-2191 ◽  
Author(s):  
R.S. Miyaoka ◽  
S.G. Kohlmyer ◽  
T.K. Lewellen
Keyword(s):  
Imaging System ◽  
Detection Limits ◽  
Sphere Detection ◽  
Coincidence Imaging

PERFORMANCE OF A COINCIDENCE IMAGING SYSTEM WITH DUAL HEAD CAMERA,

1999 ◽  
Vol 24 (3) ◽  
pp. 218
Author(s):  
J. Luo ◽  
H. El-Zeftawy ◽  
S. Atay ◽  
H. M. Abdel-Dayem
Keyword(s):  
Imaging System ◽  
Coincidence Imaging

Development and evaluation of a prototype detector for an intraoperative laparoscopic coincidence imaging system with PET tracers

2020 ◽  
Author(s):  
Madhushanka R. Liyanaarachchi ◽  
Kenji Shimazoe ◽  
Hiroyuki Takahashi ◽  
Keiichi Nakagawa ◽  
Etsuko Kobayashi ◽  
...  
Keyword(s):  
Imaging System ◽  
Pet Tracers ◽  
Coincidence Imaging ◽  
Prototype Detector

New Aspects in the Design of Electron Optical Magnification Systems

1972 ◽  
Vol 30 ◽  
pp. 606-607
Author(s):  
Willem H.J. Andersen
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Chromatic Aberration ◽  
Research Tool ◽  
Energy Losses ◽  
Objective Lens ◽  
Theoretical Limit ◽  
Optical Magnification ◽  
Chromatic Aberrations ◽  
High Degree

Electron microscope design, and particularly the design of the imaging system, has reached a high degree of perfection. Present objective lenses perform up to their theoretical limit, while the whole imaging system, consisting of three or four lenses, provides very wide ranges of magnification and diffraction camera length with virtually no distortion of the image. Evolution of the electron microscope in to a routine research tool in which objects of steadily increasing thickness are investigated, has made it necessary for the designer to pay special attention to the chromatic aberrations of the magnification system (as distinct from the chromatic aberration of the objective lens). These chromatic aberrations cause edge un-sharpness of the image due to electrons which have suffered energy losses in the object.There exist two kinds of chromatic aberration of the magnification system; the chromatic change of magnification, characterized by the coefficient Cm, and the chromatic change of rotation given by Cp.

Some Quantification Problems in Parallel EELS Images

1990 ◽  
Vol 48 (2) ◽  
pp. 36-37
Author(s):  
G. Botton ◽  
G. L’Espérance ◽  
M.D. Ball ◽  
C.E. Gallerneault
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Signal To Noise Ratio ◽  
Scanning Transmission Electron Microscope ◽  
Acquisition Time ◽  
Thickness Variation ◽  
Transmission Electron ◽  
Distribution Of Elements ◽  
Scanning Transmission ◽  
Present Distribution

The recently developed parallel electron energy loss spectrometers (PEELS) have led to a significant reduction in spectrum acquisition time making EELS more useful in many applications in material science. Dwell times as short as 50 msec per spectrum with a PEELS coupled to a scanning transmission electron microscope (STEM), can make quantitative EEL images accessible. These images would present distribution of elements with the high spatial resolution inherent to EELS. The aim of this paper is to briefly investigate the effect of acquisition time per pixel on the signal to noise ratio (SNR), the effect of thickness variation and crystallography and finally the energy stability of spectra when acquired in the scanning mode during long periods of time.The configuration of the imaging system is the following: a Gatan PEELS is coupled to a CM30 (TEM/STEM) electron microscope, the control of the spectrometer and microscope is performed through a LINK AN10-85S MCA which is interfaced to a IBM RT 125 (running under AIX) via a DR11W line.

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