Generalized image matching: Statistical learning of physically-based deformations

Compositional Analysis of III-V Interface Lattice Images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600001331 ◽

1980 ◽

Vol 38 ◽

pp. 318-319

Author(s):

A. Olsen ◽

J.C.H. Spence ◽

P. Petroff

Keyword(s):

Crystal Structure ◽

Image Matching ◽

Compositional Analysis ◽

Depth Of Field ◽

Limit Set ◽

High Contrast ◽

Resolution Limit ◽

Fourier Image ◽

Lattice Images ◽

True Structure

Since the point resolution of the JEOL 200CX electron microscope is up = 2.6Å it is not possible to obtain a true structure image of any of the III-V or elemental semiconductors with this machine. Since the information resolution limit set by electronic instability (1) u0 = (2/πλΔ)½ = 1.4Å for Δ = 50Å, it is however possible to obtain, by choice of focus and thickness, clear lattice images both resembling (see figure 2(b)), and not resembling, the true crystal structure (see (2) for an example of a Fourier image which is structurally incorrect). The crucial difficulty in using the information between Up and u0 is the fractional accuracy with which Af and Cs must be determined, and these accuracies Δff/4Δf = (2λu2Δf)-1 and ΔCS/CS = (λ3u4Cs)-1 (for a π/4 phase change, Δff the Fourier image period) are strongly dependent on spatial frequency u. Note that ΔCs(up)/Cs ≈ 10%, independent of CS and λ. Note also that the number n of identical high contrast spurious Fourier images within the depth of field Δz = (αu)-1 (α beam divergence) decreases with increasing high voltage, since n = 2Δz/Δff = θ/α = λu/α (θ the scattering angle). Thus image matching becomes easier in semiconductors at higher voltage because there are fewer high contrast identical images in any focal series.

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Rapid Serial Auditory Presentation

Experimental Psychology (formerly Zeitschrift für Experimentelle Psychologie) ◽

10.1027/1618-3169/a000295 ◽

2015 ◽

Vol 62 (5) ◽

pp. 346-351 ◽

Cited By ~ 15

Author(s):

Ana Franco ◽

Julia Eberlen ◽

Arnaud Destrebecqz ◽

Axel Cleeremans ◽

Julie Bertels

Keyword(s):

Statistical Learning ◽

Reaction Times ◽

Visual Presentation ◽

Detection Task ◽

Speech Segmentation ◽

Auditory Presentation ◽

Indirect Measure ◽

Speech Stream ◽

Adult Participants ◽

Presentation Procedure

Abstract. The Rapid Serial Visual Presentation procedure is a method widely used in visual perception research. In this paper we propose an adaptation of this method which can be used with auditory material and enables assessment of statistical learning in speech segmentation. Adult participants were exposed to an artificial speech stream composed of statistically defined trisyllabic nonsense words. They were subsequently instructed to perform a detection task in a Rapid Serial Auditory Presentation (RSAP) stream in which they had to detect a syllable in a short speech stream. Results showed that reaction times varied as a function of the statistical predictability of the syllable: second and third syllables of each word were responded to faster than first syllables. This result suggests that the RSAP procedure provides a reliable and sensitive indirect measure of auditory statistical learning.

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