Surface phase transitions of adsorbed collector molecules as revealed by in situ FT-IR/IRS spectroscopy

1993 ◽  
Vol 10 (2) ◽  
pp. 75-80
Author(s):  
J. J. Kellar ◽  
W. M. Cross ◽  
M. R. Yalamanchili ◽  
C. A. Young ◽  
J. D. Miller
Keyword(s):  
Phase Transitions ◽  
Surface Phase ◽  
Surface Phase Transitions ◽  
Ft Ir

Rheed Studies of a-Axis Oriented DyBa2Cu3O7 Films Grown by All-MBE

1997 ◽  
Vol 502 ◽  
Author(s):  
Ivan Bozovic ◽  
J. N. Eckstein ◽  
Natasha Bozovic ◽  
J. O'Donnell
Keyword(s):  
Phase Transitions ◽  
Secondary Phase ◽  
Atomic Layer ◽  
High Energy ◽  
Layer By Layer ◽  
Growth Modes ◽  
Flow Surface ◽  
Surface Phase Transitions

ABSTRACTReal-time, in-situ surface monitoring by reflection high-energy electron diffraction (RHEED) has been the key enabling component of atomic-layer-by-layer molecular beam epitaxy (ALL-MBE) of complex oxides. RHEED patterns contain information on crystallographic arrangements and long range order on the surface; this can be made quantitative with help of numerical simulations. The dynamics of RHEED patterns and intensities reveal a variety of phenomena such as nucleation and dissolution of secondary-phase precipitates, switching between growth modes (layer-by-layer, step-flow), surface phase transitions (surface reconstruction, roughening, and even phase transitions induced by the electron beam itself), etc. Some of these phenomena are illustrated here, using as a case study our recent growth of atomically smooth a-axis oriented DyBa2Cu3O7 films.

scholarly journals Surface Phase Transitions Induced by Electron Mediated Adatom-Adatom Interaction

2003 ◽  
Vol 91 (7) ◽  
Author(s):  
Junren Shi ◽  
Biao Wu ◽  
X. C. Xie ◽  
E. W. Plummer ◽  
Zhenyu Zhang
Keyword(s):  
Phase Transitions ◽  
Surface Phase ◽  
Surface Phase Transitions

Low Energy Electron Microscopy of Surface Processes on Clean Si(111) and Si (100)

1989 ◽  
Vol 159 ◽  
Author(s):  
E. Bauer ◽  
M. Mundschau ◽  
W. Swiech ◽  
W. Telieps
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Crystal Growth ◽  
Surface Defects ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Processes ◽  
Surface Phase ◽  
Surface Phase Transitions ◽  
Low Energy Electron

ABSTRACTLow energy electron microscopy (LEEM) is briefly introduced and its application to the study of surface defects, surface phase transitions on Si(111), crystal growth and sublimation on Si(100) is illustrated.

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