Neutron diffraction study of the short-range order in TeO2−M2O (M=Li, Na, K, Rb) glasses

1994 ◽  
Vol 75 (1-4) ◽  
pp. 253-256
Author(s):  
S. Neov ◽  
I. Gerasimova ◽  
V. Kozhukharov ◽  
P. Mikula ◽  
P. Lukáš
1985 ◽  
Vol 54 (7) ◽  
pp. 2543-2551 ◽  
Author(s):  
Yasuaki Sugizaki ◽  
Sadae Yamaguchi ◽  
Shinya Hashimoto ◽  
Makoto Hirabayashi ◽  
Yoshikazu Ishikawa

1994 ◽  
Vol 6 (8) ◽  
pp. 1461-1471 ◽  
Author(s):  
U Knell ◽  
H Wipf ◽  
G Lautenschlager ◽  
R Hock ◽  
H Weitzel ◽  
...  

1996 ◽  
Vol 51 (12) ◽  
pp. 1179-1184 ◽  
Author(s):  
H. Uhlig ◽  
M. Frieß ◽  
J. Dürr ◽  
R. Bellissent ◽  
H.-P. Lamparter ◽  
...  

Abstract In the present work, amorphous Si0.40C0.24N0.36 samples were investigated. X-ray and neutron diffraction experiments were performed, in order to evaluate the structure factors by the method of contrast variation. The structure can be described as crosslinked Si-N-C matrices. Within these matrices SiN4 tetrahedra are predominant. Direct Si-Si contact does not occur. We report on the short range order and the nature of chemical bonding.


1985 ◽  
Vol 46 (C8) ◽  
pp. C8-87-C8-92 ◽  
Author(s):  
R. Bellissent ◽  
J. Bigot ◽  
Y. Calvayrac ◽  
S. Lefebvre ◽  
A. Quivy

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