An electrochemical etching procedure for fabricating scanning tunneling microscopy and atom-probe field-ion microscopy tips

Yeong-Cheol Kim; David N. Seidman

doi:10.1007/bf03027195

An electrochemical etching procedure for fabricating scanning tunneling microscopy and atom-probe field-ion microscopy tips

Metals and Materials International ◽

10.1007/bf03027195 ◽

2003 ◽

Vol 9 (4) ◽

pp. 399-404 ◽

Cited By ~ 12

Author(s):

Yeong-Cheol Kim ◽

David N. Seidman

Keyword(s):

Scanning Tunneling Microscopy ◽

Electrochemical Etching ◽

Atom Probe ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study of metal surfaces by scanning tunneling microscopy with field ion microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575373 ◽

1988 ◽

Vol 6 (2) ◽

pp. 524-528 ◽

Cited By ~ 36

Author(s):

Y. Kuk ◽

P. J. Silverman ◽

H. Q. Nguyen

Keyword(s):

Scanning Tunneling Microscopy ◽

Metal Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Ion Microscopy

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Studies of individual nanometer‐sized metallic clusters using scanning tunneling microscopy, field emission, and field ion microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576156 ◽

1989 ◽

Vol 7 (4) ◽

pp. 2845-2849 ◽

Cited By ~ 29

Author(s):

T. Castro ◽

Y. Z. Li ◽

R. Reifenberger ◽

E. Choi ◽

S. B. Park ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Metallic Clusters ◽

Ion Microscopy

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An ultrahigh vacuum tip transfer system for the scanning tunneling microscopy/field ion microscopy

Review of Scientific Instruments ◽

10.1063/1.1141905 ◽

1990 ◽

Vol 61 (1) ◽

pp. 81-85 ◽

Cited By ~ 9

Author(s):

Kazuyoshi Sugihara ◽

Akira Sakai ◽

Yoshiaki Akama ◽

Naohiro Shoda ◽

Yoshihide Kato ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Ultrahigh Vacuum ◽

Scanning Tunneling ◽

Transfer System ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study of metal surfaces by scanning tunneling microscopy with field ion microscopy

Vacuum ◽

10.1016/0042-207x(89)91020-8 ◽

1989 ◽

Vol 39 (10) ◽

pp. 1005

Keyword(s):

Scanning Tunneling Microscopy ◽

Metal Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Ion Microscopy

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Theory of electron tunneling in scanning tunneling microscopy and field ion microscopy

Applied Surface Science ◽

10.1016/0169-4332(94)90361-1 ◽

1994 ◽

Vol 76-77 ◽

pp. 312-321 ◽

Cited By ~ 3

Author(s):

Masaru Tsukada

Keyword(s):

Scanning Tunneling Microscopy ◽

Electron Tunneling ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Ion Microscopy

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Solid Phase Epitaxy on Si Surfaces Studied by Scanning Tunneling Microscopy. Recent Progress in Atom Probe Field Ion Microscopy and Its Application to the Nanostructure Analysis of Magnetic Thin Films.

Hyomen Kagaku ◽

10.1380/jsssj.16.127 ◽

1995 ◽

Vol 16 (2) ◽

pp. 127-134

Author(s):

Kazuhiro HONO ◽

Toshio SAKURAI

Keyword(s):

Thin Films ◽

Recent Progress ◽

Solid Phase ◽

Magnetic Thin Films ◽

Atom Probe ◽

Scanning Tunneling ◽

Solid Phase Epitaxy ◽

Tunneling Microscopy ◽

Probe Field ◽

Ion Microscopy

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Field ion microscopy and scanning tunneling microscopy similarities and differences

Physica Scripta ◽

10.1088/0031-8949/38/2/039 ◽

1988 ◽

Vol 38 (2) ◽

pp. 315-320 ◽

Cited By ~ 1

Author(s):

T T Tsong

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Similarities And Differences ◽

Ion Microscopy

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AN ATOM PROBE FIELD ION MICROSCOPY STUDY OF DISLOCATION-SOLUTE INTERACTIONS NEAR TWIN BOUNDARIES IN WEB SILICON

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988685 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-503-C6-507 ◽

Cited By ~ 2

Author(s):

R. JAYARAM ◽

J. A. SPITZNAGEL

Keyword(s):

Atom Probe ◽

Microscopy Study ◽

Twin Boundaries ◽

Probe Field ◽

Field Ion Microscopy ◽

Solute Interactions ◽

Ion Microscopy

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Microstructural development in PWA-1480 electron beam welds — an atom probe field ion microscopy study

Applied Surface Science ◽

10.1016/0169-4332(95)00387-8 ◽

1996 ◽

Vol 94-95 ◽

pp. 280-287 ◽

Cited By ~ 9

Author(s):

S.S. Babu ◽

S.A. David ◽

M.K. Miller

Keyword(s):

Electron Beam ◽

Atom Probe ◽

Microscopy Study ◽

Microstructural Development ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

Ion Microscopy

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