Investigation of structural change of purple membrane in storage by transmission electron microscope and atomic force microscope

2001 ◽  
Vol 46 (20) ◽  
pp. 1753-1756 ◽  
Author(s):  
Li Xiaodong ◽  
Li Zongli ◽  
Yan Jiusheng ◽  
Li Hui ◽  
Han Baoshan ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Structural Change ◽  
Atomic Force Microscope ◽  
Transmission Electron Microscope ◽  
Purple Membrane ◽  
Atomic Force ◽  
Transmission Electron

Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope

1997 ◽  
Vol 3 (3) ◽  
pp. 203-213 ◽  
Author(s):  
J.A. DeRose ◽  
J.-P. Revel
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Scanning Force Microscopy ◽  
Image Deconvolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Scanning Force

Abstract: We have developed a method for the examination of atomic force microscopy (scanning force microscopy) tips using a high-resolution transmission electron microscope (TEM). The tips can be imaged in a nondestructive way, enabling one to observe the shape of an atomic force microscope probe in the vicinity of the apex with high resolution. We have obtained images of atomic force microscopy probes with a resolution on the order of 1 nm. The tips can be imaged repeatedly, so one can examine tips before and after use. We have found that the tip can become blunted with use, the rate of wear depending upon the sample and tip materials and the scanning conditions. We have also found that the tips easily accrue contamination. We have studied both commercially produced tips, as well as tips grown by electron beam deposition. Direct imaging in the TEM should prove useful for image deconvolution methods because one does not have to make any assumptions concerning the general shape of the tip profile.

Wear Characteristics of Atomic Force Microscope Probe Tips

2005 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Dae-Eun Kim
Keyword(s):  
Electron Microscope ◽  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Wear Characteristics ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Probe ◽  
Silicon Silicon ◽  
Microscope Probe ◽  
Scanning Electron

In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (FESEM) analyses were utilized. Using the Archard’s wear equation, the degree of the probe tip wear was quantitatively assessed. Based on the experimental results and analysis, the plausible wear mechanisms of the AFM probe tips were proposed in an effort to understand the nano-scale wear.

Surface Waves and Strain Modulations in Si1-xGex Alloy Layers on Si

1992 ◽  
Vol 280 ◽  
Author(s):  
A. G. Cullis ◽  
D. J. Robbins ◽  
A. J. Pidduck ◽  
P. W. Smith
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Elastic Strain ◽  
Small Scale ◽  
Layer System ◽  
Atomic Force ◽  
Scale Layer ◽  
Transmission Electron ◽  
Detailed Nature ◽  
Contrast Studies

ABSTRACTThe growth of strained, continuous Si1-xGex epitaxial alloy layers on Si can, under certain conditions, result in the occurrence of marked, small-scale layer thickness fluctuations in the form of crystallographically-aligned, interlocking ripple arrays. In the present work, combined transmission electron microscope (TEM) and atomic force microscope studies are employed to reveal the detailed nature of these surface ripples. TEM contrast studies demonstrate that well-defined, oscillatory strain variations accompany these ripple structures, the presence of which is shown to be associated with partial elastic strain-relief and lowering of the energy of die strained-layer system.

Deep-blue-emitting nanoaggregates from carbazole-based dyes in water

2021 ◽  
Author(s):  
Xiaohui Li ◽  
Qi Zhang ◽  
Xin Zhang
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Microscope ◽  
Nmr Spectroscopy ◽  
Transmission Electron Microscope ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Deep Blue ◽  
Atomic Force ◽  
Transmission Electron

New amphiphilic carbazole-based dyes assemble in water into deep-blue-emitting, highly fluorescent helical aggregates as observed by transmission electron microscope and atomic force microscopy. Single crystal X-ray diffraction and NMR spectroscopy...

A Reproducible Selective Stain for Cardiac Sarcoplasmic Reticulum

1974 ◽  
Vol 32 ◽  
pp. 214-215
Author(s):  
R. A. Waugh ◽  
J. R. Sommer
Keyword(s):  
Complex System ◽  
Electron Microscope ◽  
Sarcoplasmic Reticulum ◽  
Transmission Electron Microscope ◽  
Electron Microscopic ◽  
Cardiac Sarcoplasmic Reticulum ◽  
Transmission Electron

Cardiac sarcoplasmic reticulum (SR) is a complex system of intracellular tubules that, due to their small size and juxtaposition to such electron-dense structures as mitochondria and myofibrils, are often inconspicuous in conventionally prepared electron microscopic material. This study reports a method with which the SR is selectively “stained” which facilitates visualizationwith the transmission electron microscope.

Surface Structure of the Spores of Glugea Weissenbergi

1969 ◽  
Vol 27 ◽  
pp. 238-239
Author(s):  
Sanford H. Vernick ◽  
Anastasios Tousimis ◽  
Victor Sprague
Keyword(s):  
Electron Microscope ◽  
Surface Structure ◽  
Transmission Electron Microscope ◽  
Mature Spore ◽  
Spore Surface ◽  
Sectioned Material ◽  
Transmission Electron ◽  
Surface Detail

Recent electron microscope studies have greatly expanded our knowledge of the structure of the Microsporida, particularly of the developing and mature spore. Since these studies involved mainly sectioned material, they have revealed much internal detail of the spores but relatively little surface detail. This report concerns observations on the spore surface by means of the transmission electron microscope.

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

1969 ◽  
Vol 27 ◽  
pp. 176-177 ◽  
Author(s):  
H. Tochigi ◽  
H. Uchida ◽  
S. Shirai ◽  
K. Akashi ◽  
D. J. Evins ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Objective Lens ◽  
High Excitation ◽  
Transmission Electron ◽  
New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

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