A low cost PC based card for heat-capacity measurements at low temperatures

Pramana ◽  
1995 ◽  
Vol 45 (1) ◽  
pp. 81-89 ◽  
Author(s):  
R S Sannabhadti ◽  
S Ramakrishnan ◽  
K Ghosh ◽  
Arun Patade ◽  
Girish Chandra
Keyword(s):  
Heat Capacity ◽  
Low Temperatures ◽  
Low Cost ◽  
Heat Capacity Measurements

Investigation of the Thermal Properties of Solid CH3D at Very Low Temperatures

1975 ◽  
Vol 53 (22) ◽  
pp. 2546-2548 ◽  
Author(s):  
E. P. Jones ◽  
J. A. Morrison ◽  
E. L. Richards
Keyword(s):  
Heat Capacity ◽  
Low Temperatures ◽  
Spin Symmetry ◽  
Entropy Change ◽  
Total Conversion ◽  
Time Effects ◽  
Thermal Equilibration ◽  
Symmetry Species ◽  
Orientational Ordering ◽  
Heat Capacity Measurements

Heat capacity measurements have been performed on solid CH3D over the range 0.15 < T < 4 K where a large Schottky anomaly occurs. The entropy change in the anomaly is estimated to be 1.80 ± 0.10R which is about 14% less than that corresponding to complete orientational ordering of the molecules and total conversion of nuclear spin symmetry species. Some time effects associated with thermal equilibration have also been studied.

Heat Capacity Measurements on Small Samples at Low Temperatures

1972 ◽  
Vol 43 (2) ◽  
pp. 205-214 ◽  
Author(s):  
R. Bachmann ◽  
F. J. DiSalvo ◽  
T. H. Geballe ◽  
R. L. Greene ◽  
R. E. Howard ◽  
...  
Keyword(s):  
Heat Capacity ◽  
Low Temperatures ◽  
Small Samples ◽  
Heat Capacity Measurements

HEAT CAPACITY MEASUREMENTS ON THE DILUTED ISING SYSTEM Cs3CopZn1-pCl5

1971 ◽  
Vol 32 (C1) ◽  
pp. C1-1008-C1-1009 ◽  
Author(s):  
E. LAGENDIJK ◽  
W. J. HUISKAMP ◽  
P. F. BONGERS
Keyword(s):  
Heat Capacity ◽  
Ising System ◽  
Heat Capacity Measurements

Low Temperature Fault Isolation Using Soft Defect Localization

2012 ◽  
Author(s):  
Kristopher D. Staller
Keyword(s):  
Low Temperatures ◽  
Laser Scanning ◽  
Low Cost ◽  
Fault Isolation ◽  
Laser Scanning Microscopy ◽  
Cold Temperature ◽  
Multiple Point ◽  
Defect Localization ◽  
Low Levels

Abstract Cold temperature failures are often difficult to resolve, especially those at extreme low levels (&lt; -40°C). Momentary application of chill spray can confirm the failure mode, but is impractical during photoemission microscopy (PEM), laser scanning microscopy (LSM), and multiple point microprobing. This paper will examine relatively low-cost cold temperature systems that can hold samples at steady state extreme low temperatures and describe a case study where a cold temperature stage was combined with LSM soft defect localization (SDL) to rapidly identify the cause of a complex cold temperature failure mechanism.

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