Analysis of ultrasonic fields and flaw detection in aluminum single crystals based on laser detection technique

2000 ◽  
Vol 36 (11) ◽  
pp. 831-838 ◽  
Author(s):  
A. B. Rinkevich ◽  
Ya. G. Smorodinskii ◽  
A. M. Burkhanov ◽  
A. S. Krivonosova ◽  
B. Keller
Keyword(s):  
Single Crystals ◽  
Flaw Detection ◽  
Detection Technique ◽  
Laser Detection ◽  
Ultrasonic Fields

J0406-3-6 Flaw Detection Technique of a Multi-Layer Sample with Ultrasonic Wave

2009 ◽  
Vol 2009.6 (0) ◽  
pp. 445-446
Author(s):  
Hiroshi Yamamoto ◽  
Naoya Kawakami ◽  
Takahisa Maruyama ◽  
Hiroaki Yanagimoto
Keyword(s):  
Ultrasonic Wave ◽  
Flaw Detection ◽  
Detection Technique ◽  
Layer Sample

Research and Prospect of Cat-Eye Effect Used for Active Laser Detection Technique

2010 ◽  
Vol 47 (10) ◽  
pp. 102802
Author(s):  
赵延仲 Zhao Yanzhong ◽  
孙华燕 Sun Huayan ◽  
宋丰华 Song Fenghua ◽  
谷锁林 Gu Suolin
Keyword(s):  
Detection Technique ◽  
Laser Detection ◽  
Active Laser

STUDY OF ITINERANT HOLES IN PLANAR AND APICAL OXYGEN IN TWO DIFFERENT BSCCO (2212) SINGLE CRYSTALS USING POLARISED X-RAY ABSORPTION

2004 ◽  
Vol 18 (20n21) ◽  
pp. 2841-2848 ◽  
Author(s):  
B. DALELA ◽  
S. DALELA ◽  
N. L. Saini ◽  
R. K. SINGHAL ◽  
C. T. Chen ◽  
...  
Keyword(s):  
Single Crystals ◽  
Detection Technique ◽  
Hole Density ◽  
Apical Oxygen ◽  
X Ray ◽  
X Ray Absorption ◽  
Absorption Measurements

X-ray absorption measurements have been made on Cu L 3 and O K-edge on BSCCO (2212) single crystals annealed under two different conditions at 1 bar O 2 (under-doped) and another annealed in 1:4 ratio of O 2: Ar (optimally doped) using the F. Y. detection technique. Our results clearly indicate that hole density decreases while going towards c-axis from the ab plane. Our results shows that the doping holes have predominantly x, y symmetry compared to those having pz symmetry. The T c for both the crystals does not depend on the density of doping holes in the apical oxygen. However, the matter needs to be further explored.

The Microstructure of Shock-Synthesized Diamond

1967 ◽  
Vol 25 ◽  
pp. 324-325
Author(s):  
Lucien F. Trueb
Keyword(s):  
Single Crystals ◽  
Preferred Orientation ◽  
High Magnification ◽  
Texture Pattern ◽  
Shock Process ◽  
New Type ◽  
Diffraction Diagram

A new type of synthetic industrial diamond formed by an explosive shock process has been recently developed by the Du Pont Company. This material consists of a mixture of two basically different forms, as shown in Figure 1: relatively flat and compact aggregates of acicular crystallites, and single crystals in the form of irregular polyhedra with straight edges.Figure 2 is a high magnification micrograph typical for the fibrous aggregates; it shows that they are composed of bundles of crystallites 0.05-0.3 μ long and 0.02 μ. wide. The selected area diffraction diagram (insert in Figure 2) consists of a weak polycrystalline ring pattern and a strong texture pattern with arc reflections. The latter results from crystals having preferred orientation, which shows that in a given particle most fibrils have a similar orientation.

A New Defect in Polyethylene Single Crystals

1973 ◽  
Vol 31 ◽  
pp. 70-71
Author(s):  
E. L. Thomas ◽  
S. L. Sass
Keyword(s):  
Single Crystals ◽  
Screw Dislocation ◽  
Small Distance ◽  
Dipole Model ◽  
Dislocation Dipole ◽  
Chain Folding ◽  
Black And White ◽  
Polymer Crystal ◽  
Different Types

In polyethylene single crystals pairs of black and white lines spaced 700-3,000Å apart, parallel to the [100] and [010] directions, have been identified as microsector boundaries. A microsector is formed when the plane of chain folding changes over a small distance within a polymer crystal. In order for the different types of folds to accommodate at the boundary between the 2 fold domains, a staggering along the chain direction and a rotation of the chains in the plane of the boundary occurs. The black-white contrast from a microsector boundary can be explained in terms of these chain rotations. We demonstrate that microsectors can terminate within the crystal and interpret the observed terminal strain contrast in terms of a screw dislocation dipole model.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

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