A study of forward elastic-scattering peaks of K+p and $$\overline p p$$ reactions using the diffraction modelreactions using the diffraction model

1970 ◽  
Vol 67 (2) ◽  
pp. 217-224 ◽  
Author(s):  
M. D. Warty
Keyword(s):  
Elastic Scattering ◽  
Diffraction Model

Analysis of elastic scattering of polarized 7Li on 58Ni within the diffraction model

1981 ◽  
Author(s):  
Z. Moroz ◽  
R. Böttger ◽  
P. Egelhof ◽  
T. F. Hill ◽  
K.-H. Möbius ◽  
...  
Keyword(s):  
Elastic Scattering ◽  
Diffraction Model

Elastic Scattering of 14N on 9Be at 25 MeV and 16O on 11B at 30 MeV

1966 ◽  
Vol 21 (7) ◽  
pp. 946-949 ◽  
Author(s):  
W. v. Oertzen ◽  
R. Bock ◽  
M. Grosse—Schulte
Keyword(s):  
Boundary Condition ◽  
Elastic Scattering ◽  
Optical Model ◽  
Transfer Reactions ◽  
Reflection Coefficients ◽  
Model Calculations ◽  
Angular Region ◽  
Diffraction Model ◽  
Wave Boundary

The elastic scattering of 14N on 9Be at 25 MeV and 16Ο on 11B at 30 MeV has been measured and analyzed with Optical Model and Ingoing Wave Boundary Condition calculations. Acceptable fits were obtained for the angular region below 100° c.m. The reflection coefficients derived from these calculations are compared with the Diffraction Model calculations of DAR to the corresponding p- and α-transfer reactions, in which a WOODS-SAXON distribution of the reflection coefficients is used.

Radius anomaly in the diffraction model for heavy-ion elastic scattering

1984 ◽  
Vol 29 (4) ◽  
pp. 1326-1330 ◽  
Author(s):  
L. N. Pandey ◽  
S. N. Mukherjee
Keyword(s):  
Elastic Scattering ◽  
Heavy Ion ◽  
Diffraction Model

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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