Phase distribution and phase analysis in Cu6Sn5, Ni3Sn4, and the Sn-rich corner in the ternary Sn-Cu-Ni isotherm at 240°C

Chia-Ying Li; Guo-Jyun Chiou; Jenq-Gong Duh

doi:10.1007/bf02692455

Microshape Measurement Method Using Speckle Interferometry Based on Phase Analysis

Photonics ◽

10.3390/photonics8040112 ◽

2021 ◽

Vol 8 (4) ◽

pp. 112

Author(s):

Yasuhiko Arai

Keyword(s):

Fine Structure ◽

Phase Analysis ◽

Measurement Method ◽

Phase Distribution ◽

Periodic Structures ◽

Scattered Light ◽

Speckle Interferometry ◽

Diffraction Limit ◽

Silica Microspheres ◽

Measured Object

A method for the measurement of the shape of a fine structure beyond the diffraction limit based on speckle interferometry has been reported. In this paper, the mechanism for measuring the shape of the fine structure in speckle interferometry using scattered light as the illumination light is discussed. Furthermore, by analyzing the phase distribution of the scattered light from the surface of the measured object, this method can be used to measure the shapes of periodic structures and single silica microspheres beyond the diffraction limit.

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Amplitude-Phase Analysis of Cosmic Microwave Background Maps

Symposium - International Astronomical Union ◽

10.1017/s0074180900216197 ◽

2005 ◽

Vol 201 ◽

pp. 134-137

Author(s):

D. Novikov ◽

P. Naselsky ◽

J. Silk

Keyword(s):

Cosmic Microwave Background ◽

Phase Analysis ◽

Phase Distribution ◽

Point Sources ◽

Microwave Background ◽

Novel Method

We propose a novel method for the extraction of unresolved point sources from CMB maps. This method is based on the analysis of the phase distribution of the Fourier components for the observed signal and unlike most other methods of denoising does not require any significant assumptions about the expected CMB signal. The aim of our investigation is to show how, using our algorithm, the contribution from point sources can be separated from the resulting signal on all scales.

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High-Speed Measurement of Shape and Vibration: Whole-Field Systems for Motion Capture and Vibration Modal Analysis by OPPA Method

Sensors ◽

10.3390/s20154263 ◽

2020 ◽

Vol 20 (15) ◽

pp. 4263

Author(s):

Yoshiharu Morimoto

Keyword(s):

Modal Analysis ◽

Phase Analysis ◽

Motion Capture ◽

High Speed ◽

Phase Distribution ◽

Conveyor Belt ◽

Human Motion ◽

Shape Measurement ◽

The One ◽

Vibration Modal

In shape measurement systems using a grating projection method, the phase analysis of a projected grating provides accurate results. The most popular phase analysis method is the phase shifting method, which requires several images for one shape analysis. Therefore, the object must not move during the measurement. The authors previously proposed a new accurate and high-speed shape measurement method, i.e., the one-pitch phase analysis (OPPA) method, which can determine the phase at every point of a single image of an object with a grating projected onto it. In the OPPA optical system, regardless of the distance of the object from the camera, the one-pitch length (number of pixels) on the imaging surface of the camera sensor is always constant. Therefore, brightness data for one pitch at any point of the image can be easily analyzed to determine phase distribution, or shape. This technology will apply to the measurement of objects in motion, including automobiles, robot arms, products on a conveyor belt, and vibrating objects. This paper describes the principle of the OPPA method and example applications for real-time human motion capture and modal analysis of free vibration of a flat cantilever plate after hammering. The results show the usefulness of the OPPA method.

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Digital phase analysis in interference electron microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106272 ◽

1988 ◽

Vol 46 ◽

pp. 842-843

Author(s):

S. Hasegawa ◽

T. Kawasaki ◽

J. Endo ◽

M. Futamoto ◽

A. Tonomura

Keyword(s):

Magnetic Field ◽

Electron Microscopy ◽

Phase Distribution ◽

Magnetic Recording Media ◽

Electron Wave ◽

Vector Potentials ◽

Weak Magnetic Fields ◽

Leakage Magnetic Field ◽

Optical Reconstruction ◽

Processing Techniques

Interference electron microscopy enables us to record the phase distribution of an electron wave on a hologram. The distribution is visualized as a fringe pattern in a micrograph by optical reconstruction. The phase is affected by electromagnetic potentials; scalar and vector potentials. Therefore, the electric and magnetic field can be reduced from the recorded phase. This study analyzes a leakage magnetic field from CoCr perpendicular magnetic recording media. Since one contour fringe interval corresponds to a magnetic flux of Φo(=h/e=4x10-15Wb), we can quantitatively measure the field by counting the number of finges. Moreover, by using phase-difference amplification techniques, the sensitivity for magnetic field detection can be improved by a factor of 30, which allows the drawing of a Φo/30 fringe. This sensitivity, however, is insufficient for quantitative analysis of very weak magnetic fields such as high-density magnetic recordings. For this reason we have adopted “fringe scanning interferometry” using digital image processing techniques at the optical reconstruction stage. This method enables us to obtain subfringe information recorded in the interference pattern.

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Application of electron holography to material science studies on magnetic domain states of small particles

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100150976 ◽

1993 ◽

Vol 51 ◽

pp. 1028-1029

Author(s):

T. Hirayama ◽

Q. Ru ◽

T. Tanji ◽

A. Tonomura

Keyword(s):

Magnetic Field ◽

Material Science ◽

Science Studies ◽

Phase Distribution ◽

Carbon Film ◽

Objective Lens ◽

Electron Holography ◽

Transform Method ◽

Transmission Electron ◽

Thin Carbon

The observation of small magnetic materials is one of the most important applications of electron holography to material science, because interferometry by means of electron holography can directly visualize magnetic flux lines in a very small area. To observe magnetic structures by transmission electron microscopy it is important to control the magnetic field applied to the specimen in order to prevent it from changing its magnetic state. The easiest method is tuming off the objective lens current and focusing with the first intermediate lens. The other method is using a low magnetic-field lens, where the specimen is set above the lens gap.Figure 1 shows an interference micrograph of an isolated particle of barium ferrite on a thin carbon film observed from approximately [111]. A hologram of this particle was recorded by the transmission electron microscope, Hitachi HF-2000, equipped with an electron biprism. The phase distribution of the object electron wave was reconstructed digitally by the Fourier transform method and converted to the interference micrograph Fig 1.

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Microstructure and microanalysis of sintered Fe-Nd-B permanent magnets

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100178082 ◽

1990 ◽

Vol 48 (4) ◽

pp. 990-991

Author(s):

Mahesh Chandramouli

Keyword(s):

Electron Microscope ◽

Liquid Phase ◽

Permanent Magnets ◽

Phase Distribution ◽

Energy Dispersive Spectrometer ◽

Nucleation And Growth ◽

Liquid Phase Sintering ◽

Domain Wall Energy ◽

Oxide Phases ◽

Scanning Electron

Magnetization reversal in sintered Fe-Nd-B, a complex, multiphase material, occurs by nucleation and growth of reverse domains making the isolation of the ferromagnetic Fe14Nd2B grains by other nonmagnetic phases crucial. The magnets used in this study were slightly rich in Nd (in comparison to Fe14Nd2B) to promote the formation of Nd-oxides at multigrain junctions and incorporated Dy80Al20 as a liquid phase sintering addition. Dy has been shown to increase the domain wall energy thus making nucleation more difficult while Al is thought to improve the wettability of the Nd-oxide phases.Bulk polished samples were examined in a JEOL 35CF scanning electron microscope (SEM) operated at 30keV equipped with a Be window energy dispersive spectrometer (EDS) detector in order to determine the phase distribution.

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