A digital signal-processing analysis technique for the infrared reflectivity characterization of ion implanted silicon
1992 ◽
Vol 21
(11)
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pp. 1033-1040
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Keyword(s):
2009 ◽
Vol 80
(8)
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pp. 083906
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Keyword(s):
Keyword(s):
1996 ◽
Vol 1548
(1)
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pp. 38-45
Keyword(s):
Keyword(s):
1983 ◽
Vol 130
(6)
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pp. 225
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