Analysis of heat-affected zone phase transformations usingin situ spatially resolved x-ray diffraction with synchrotron radiation

1996 ◽  
Vol 27 (3) ◽  
pp. 775-783 ◽  
Author(s):  
J. W. Elmer ◽  
JOE Wong ◽  
M. Fröba ◽  
P. A. Waide ◽  
E. M. Larson
Keyword(s):  
Synchrotron Radiation ◽  
Phase Transformations ◽  
Heat Affected Zone ◽  
X Ray Diffraction ◽  
X Ray ◽  
Spatially Resolved

Phase transformations in Ni/Ti multilayers investigated by synchrotron radiation-based x-ray diffraction

2015 ◽  
Vol 646 ◽  
pp. 1165-1171 ◽  
Author(s):  
A.J. Cavaleiro ◽  
A.S. Ramos ◽  
R.M.S. Martins ◽  
F.M. Braz Fernandes ◽  
J. Morgiel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Phase Transformations ◽  
X Ray Diffraction ◽  
X Ray

In-Situ Monitoring of Phase Transformations During Welding of Steels Using Synchrotron-Based X-Ray Diffraction Techniques

2004 ◽  
Author(s):  
J. W. Elmer ◽  
T. A. Palmer
Keyword(s):  
Synchrotron Radiation ◽  
Phase Transformations ◽  
Lawrence Livermore National Laboratory ◽  
National Laboratory ◽  
Welding Process ◽  
Quantitative Measure ◽  
In Situ Monitoring ◽  
Low Alloy Steels ◽  
X Ray Diffraction ◽  
X Ray

Understanding the evolution of microstructure in welds is an important goal of welding research because of the strong correlation between weld microstructure and weld properties. To achieve this goal it is important to develop a quantitative measure of phase transformations encountered during welding in order to ultimately develop methods for predicting weld microstructures from the characteristics of the welding process. To aid in this effort, synchrotron radiation methods have been developed at Lawrence Livermore National Laboratory for direct observations of microstructure evolution during welding. Using intense, highly collimated synchrotron radiation, the atomic structure of the weld heat affected and fusion zones can be probed in real time. Two synchrotron-based techniques have been developed for these investigations, known as spatially resolved (SRXRD) and time resolved (TRXRD) x-ray diffraction, and these techniques have been used to investigate welding induced phase transformations in titanium alloys, low alloy steels, and stainless steel alloys. This paper will provide a brief overview of the application of these methods to understand microstructural evolution during the welding of low carbon (AISI 1005) and medium carbon (AISI 1045) steels, where the different levels of carbon influence the starting microstructures and the evolution of microstructures during welding.

scholarly journals Sample Environment for Operando Hard X-ray Tomography—An Enabling Technology for Multimodal Characterization in Heterogeneous Catalysis

Catalysts ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 459
Author(s):  
Johannes Becher ◽  
Sebastian Weber ◽  
Dario Ferreira Sanchez ◽  
Dmitry E. Doronkin ◽  
Jan Garrevoet ◽  
...  
Keyword(s):  
Heterogeneous Catalysis ◽  
Synchrotron Radiation ◽  
Contrast Imaging ◽  
Co2 Methanation ◽  
Full Field ◽  
X Ray ◽  
Spatially Resolved ◽  
Oxidation Of Methane ◽  
Unique Source ◽  
Sample Environment

Structure–activity relations in heterogeneous catalysis can be revealed through in situ and operando measurements of catalysts in their active state. While hard X-ray tomography is an ideal method for non-invasive, multimodal 3D structural characterization on the micron to nm scale, performing tomography under controlled gas and temperature conditions is challenging. Here, we present a flexible sample environment for operando hard X-ray tomography at synchrotron radiation sources. The setup features are discussed, with demonstrations of operando powder X-ray diffraction tomography (XRD-CT) and energy-dispersive tomographic X-ray absorption spectroscopy (ED-XAS-CT). Catalysts for CO2 methanation and partial oxidation of methane are shown as case studies. The setup can be adapted for different hard X-ray microscopy, spectroscopy, or scattering synchrotron radiation beamlines, is compatible with absorption, diffraction, fluorescence, and phase-contrast imaging, and can operate with scanning focused beam or full-field acquisition mode. We present an accessible methodology for operando hard X-ray tomography studies, which offer a unique source of 3D spatially resolved characterization data unavailable to contemporary methods.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

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