Search for UHE cosmic sources with a large-area underground muon detector

1984 ◽  
Vol 7 (6) ◽  
pp. 779-785 ◽  
Author(s):  
G. Auriemma ◽  
H. Bilokon ◽  
A. F. Grillo
Keyword(s):  
Muon Detector ◽  
Large Area ◽  
Underground Muon

Resonant oscillations of atmospheric neutrinos with an underground muon detector

1988 ◽  
Vol 37 (3) ◽  
pp. 665-676 ◽  
Author(s):  
G. Auriemma ◽  
M. Felcini ◽  
P. Lipari ◽  
J. L. Stone
Keyword(s):  
Muon Detector ◽  
Atmospheric Neutrinos ◽  
Underground Muon

Large area drift tube chambers for a muon detector at the

1980 ◽  
Vol 176 (1-2) ◽  
pp. 217-222 ◽  
Author(s):  
K. Eggert ◽  
Th. Ehlert ◽  
H. Faissner ◽  
K.L. Giboni ◽  
R. Haidan ◽  
...  
Keyword(s):  
Drift Tube ◽  
Muon Detector ◽  
Large Area

Coincidences between extensive air showers and the Soudan 1 underground muon detector

1992 ◽  
Vol 45 (5) ◽  
pp. 1459-1469 ◽  
Author(s):  
U. Das Gupta ◽  
P. Border ◽  
K. Johns ◽  
N. Longley ◽  
M. Marshak ◽  
...  
Keyword(s):  
Extensive Air Showers ◽  
Muon Detector ◽  
Air Showers ◽  
Underground Muon

scholarly journals Direct Measurement of the Muon Density in Air Showers with the Pierre Auger Observatory

2019 ◽  
Vol 210 ◽  
pp. 02013 ◽  
Author(s):  
Sarah Müller ◽  
Keyword(s):  
Soil Layer ◽  
Pierre Auger Observatory ◽  
Angle Of Incidence ◽  
Muon Detector ◽  
Air Showers ◽  
Reconstruction Procedure ◽  
Systematic Uncertainties ◽  
One Year ◽  
Inclined Angle ◽  
Underground Muon

As part of the upgrade of the Pierre Auger Observatory, the Auger Muons and Infill for the Ground Array (AMIGA) underground muon detector extension will allow for direct muon measurements for showers falling into the SD-750 array. We optimized the AMIGA muon reconstruction procedure by introducing a geometrical correction for muons leaving a signal in multiple detector strips due to their inclined angle of incidence and deriving a new unbiased parametrization of the muon lateral distribution function. Furthermore, we defined a zenith-independent estimator ρ35 of the muon density by parametrizing the attenuation of the muonic signal due to the atmosphere and soil layer above the buried detectors and quantified the relevant systematic uncertainties for AMIGA. The analysis of one year of calibrated data recorded with the prototype array of AMIGA confirms the results of previous studies indicating a disagreement between the muon content in simulations and data.

scholarly journals Calibration of the underground muon detector of the Pierre Auger Observatory

2021 ◽  
Vol 16 (04) ◽  
pp. P04003
Author(s):  
A. Aab ◽  
P. Abreu ◽  
M. Aglietta ◽  
J.M. Albury ◽  
I. Allekotte ◽  
...  
Keyword(s):  
Pierre Auger Observatory ◽  
Muon Detector ◽  
Underground Muon

scholarly journals Status and performance of the underground muon detector of the Pierre Auger Observatory

2021 ◽  
Author(s):  
Ana Martina Botti ◽  
Pedro Abreu ◽  
Marco Aglietta ◽  
Justin M. Albury ◽  
Ingomar Allekotte ◽  
...  
Keyword(s):  
Pierre Auger Observatory ◽  
Muon Detector ◽  
And Performance ◽  
Underground Muon

Convergent Beam Electron Diffraction

1978 ◽  
Vol 36 (3) ◽  
pp. 304-315
Author(s):  
G. Lehmpfuhl
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Crystal Surface ◽  
Diffraction Spot ◽  
Crystal Thickness ◽  
Large Area ◽  
Electron Microscopic ◽  
Additional Information ◽  
Microscopic Investigations

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.

Sign in / Sign up

Export Citation Format

Share Document