Application of ionic microanalysis to the determination of boron depth profiles in silicon and silica

1972 ◽  
Vol 12 (2) ◽  
pp. 85-94 ◽  
Author(s):  
B. Blanchard ◽  
N. Hilleret ◽  
J. B. Quoirin
Keyword(s):  
Author(s):  
М.Н. Дроздов ◽  
Ю.Н. Дроздов ◽  
А.И. Охапкин ◽  
С.А. Краев ◽  
М.А. Лобаев

AbstractNew possibilities offered by the method of secondary ion mass spectrometry (SIMS) for analysis of the phase composition of carbon-containing materials are considered. Differences are established between the mass spectra of three carbon phases: diamond, diamond-like carbon (DLC), and graphite. A simple algorithm for the quantitative determination of different phases in two-phase systems diamond–graphite and DLC–graphite is proposed that is based on the measurement of relative intensities of secondary cluster ions such as C_8/C_5 and CsC_8/CsC_4. It is shown that nonuniform depth profiles of various carbon phases are formed in diamond structures upon laser cutting and in DLC structures upon thermal annealing.


2009 ◽  
Vol 55 (190) ◽  
pp. 345-352 ◽  
Author(s):  
L.W. Morland

AbstractTwo previous theoretical analyses of data from the GRIP, Vostok and Byrd ice cores, presenting age–depth correlations, grain growth and dislocation-density evolution, are re-examined. It is found that the age–depth correlations are inconsistent with the idealized flow with unchanging history adopted, but that good correlations can be obtained by relaxing those restrictions. A modified grain-growth relation is proposed, consistent with the distinct growth profiles of the Vostok and other two cores, which can be solved simultaneously with the given dislocation-density evolution equation. These are solved for all three cores with the given parameters, and the depth profiles of grain diameter and dislocation density at the present time are determined with the new age–depth correlation and with that shown empirically in the papers. The varying flow history influences the age–depth correlation, and hence the depth profiles, which is important both for the interpretation of core data, and for the determination of constitutive variables at each depth at the present time.


1991 ◽  
Vol 226 ◽  
Author(s):  
T.W. Wu

AbstractAn ac-microindentation technique, namely indenting with a small displacement modulation superimposed on an otherwise linear indenter motion, will be introduced. The basic principle and theory will also be illustrated by using a mechanical model to simulate the indenter behavior.Other than being as capable as conventional indentation, the ac-technique acquires the unloading slope simultaneously and continuously with the penetration depth and applied load during an entire indentation process. With this extra information, the conversion between the total depth and plastic depth can be executed right after a single indentation, and in turn the hardness as well as. contact modulus depth profiles can be calculated. This is in contrast to the conventional indentation technique where a group of indentations associated with different maximum loads are required in order to achieve the same purpose. Furthermore, it also avoids the subjectivity in the selection of the fitting portions from the unloading stage of an indentation curve to extract the unloading slopes as well as the plastic penetration depths.Another important advantage of using this ac-technique is the high sensitivity in detecting the indenter/surface contact. This advantage is very useful in the determination of the origins of penetration depths as well as in the investigation the evolution of the contact area, and both issues are very crucial in the microhardness calculations.The strain rate effect on the hardness measurements of a 1 μm thick Al-2%Si coating has been demonstrated by using the ac-technique. As the indenter loading speed increases from 2.5 to 10 nm/sec, the measured hardness of the coating can be increased from ∼20% to ∼80% depending on the penetration depth, and the shallower the penetration depth the larger the increment is. However, the contact modulus depth profiles remain unchanged for all the indentation rates.


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