Kris—A computer program for the least-squares resolution of gamma-ray spectra by half-life and gamma-ray energy

1970 ◽  
Vol 4 (2) ◽  
pp. 375-382 ◽  
Author(s):  
B. W. Hoffman ◽  
R. E. Wainerdi
Keyword(s):  
Computer Program ◽  
Least Squares ◽  
Half Life ◽  
Gamma Ray

INVERSION OF AIRBORNE RADIOMETRIC DATA

Geophysics ◽  
1978 ◽  
Vol 43 (1) ◽  
pp. 133-143 ◽  
Author(s):  
P. J. Gunn
Keyword(s):  
Least Squares ◽  
Gamma Rays ◽  
Gamma Ray ◽  
Spectral Representation ◽  
Radioactive Elements ◽  
Intensity Field ◽  
Radiometric Data

The spectral representation describing the gamma ray intensity due to radioactive prismatic sources such as approximate areal distributions of outcropping rocks shows that such intensity fields result from the convolution of factors depending upon the height of the plane of observation, the geometry of the causative bodies, instrumental constants, and the concentrations of radioelements emitting gamma rays. Inverse filters, designed according to the Wiener least‐squares criteria, can deconvolve factors from the observed intensity field to provide direct mappings of the concentrations of radioactive elements.

STUDY OF Ir191m

1958 ◽  
Vol 36 (10) ◽  
pp. 1253-1260 ◽  
Author(s):  
J. A. R. Cloutier ◽  
A. Henrikson
Keyword(s):  
Half Life ◽  
Gamma Ray

Using the McGill 100-Mev proton synchro-cyclotron, the half-life of Ir191m has been redetermined and the value 4.53 ± 0.18 s obtained from 55 trials. The mass assignment is here based on the study of the excitation curves for both osmium and iridium targets. The measured αk = 2.0 ± 0.3 for the observed 126 ± 6 kev gamma ray is consistent with the M1 + E2 assignment previously made. No 42-kev gamma ray could be detected.

Standard X-Ray Diffraction Powder Patterns from the JCPDS Research Associateship

1986 ◽  
Vol 1 (2) ◽  
pp. 64-77 ◽  
Author(s):  
Howard F. McMurdie ◽  
Marlene C. Morris ◽  
Eloise H. Evans ◽  
Boris Paretzkin ◽  
Winnie Wong-Ng ◽  
...  
Keyword(s):  
Computer Program ◽  
Least Squares ◽  
Internal Consistency ◽  
Computer Programs ◽  
National Bureau ◽  
X Ray Diffraction ◽  
Internal Standards ◽  
X Ray ◽  
Cell Refinement ◽  
Computer Controlled

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with 1 or 2 internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

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