Grain size variation across sand ridges, New Jersey continental shelf

1981 ◽  
Vol 1 (1) ◽  
pp. 45-48 ◽  
Author(s):  
William L. Stubblefield ◽  
Donald J. P. Swift
1986 ◽  
pp. 1-72 ◽  
Author(s):  
James M. Rine ◽  
Roderick W. Tillman ◽  
William L. Stubblefield ◽  
Donald J. P. Swift

1985 ◽  
pp. 242-242
Author(s):  
R. W. Tillman ◽  
J. M. Rine ◽  
W. L. Stubblefield

Author(s):  
Serafino Caruso ◽  
Stano Imbrogno

AbstractGrain refinement by severe plastic deformation (SPD) techniques, as a mechanism to control microstructure (recrystallization, grain size changes,…) and mechanical properties (yield strength, ultimate tensile strength, strain, hardness variation…) of pure aluminium conductor wires, is a topic of great interest for both academic and industrial research activities. This paper presents an innovative finite element (FE) model able to describe the microstructural evolution and the continuous dynamic recrystallization (CDRX) that occur during equal channel angular drawing (ECAD) of commercial 1370 pure aluminium (99.7% Al). A user subroutine has been developed based on the continuum mechanical model and the Hall-Petch (H-P) equations to predict grain size variation and hardness change. The model is validated by comparison with the experimental results and a predictive analysis is conducted varying the channel die angles. The study provides an accurate prediction of both the thermo-mechanical and the microstructural phenomena that occur during the process characterized by large plastic deformation.


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