scholarly journals Residual stress analysis near a cold expanded hole in a textured alclad sheet using X-ray diffraction

2005 ◽  
Vol 45 (1) ◽  
pp. 83-88 ◽  
Author(s):  
J. C. P. Pina ◽  
A. M. Dias ◽  
P. F. P. de Matos ◽  
P. M. G. P. Moreira ◽  
P. M. S. T. de Castro
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Analysis

Residual stress analysis in aged graphite/PMR-15 composites using X-ray diffraction

2006 ◽  
Vol 421 (1-2) ◽  
pp. 1-8 ◽  
Author(s):  
B. Benedikt ◽  
M. Lewis ◽  
P. Rangaswamy ◽  
M. Kumosa ◽  
P. Predecki ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Analysis

Non-Destructive Residual Stress Analysis of Induction Hardened Components by Neutron and X-Ray Diffraction

2013 ◽  
Vol 768-769 ◽  
pp. 420-427 ◽  
Author(s):  
Jeremy Epp ◽  
Thilo Pirling ◽  
Thomas Hirsch
Keyword(s):  
Residual Stress ◽  
Chemical Composition ◽  
Residual Stresses ◽  
Stress Analysis ◽  
Stress Gradient ◽  
X Ray Diffraction ◽  
Neutron Measurement ◽  
X Ray ◽  
Layer Removal ◽  
Residual Stress Analysis

In this paper the microstructural and residual-stress analysis of an induction hardened plate of medium carbon steel is described. The stress gradient was determined using laboratory X-ray diffraction (IWT, Bremen, Germany) and neutron strain scanning (ILL, Grenoble, France). Due to slight variations of chemical composition in the depth, matchstick like (cross section 2×2mm²) d0-reference samples were prepared from a similarly treated sample. The d0shift induced by variation of chemical composition was measured by neutron and by X-ray diffraction along the strain free direction (sin²ψ*) and used for the evaluation of the neutron stress calculation. The d0distribution obtained from the neutron measurement did not appear reliable while the method using X-ray diffraction seems to be an efficient and reliable method to determine d0profiles in small samples. The evaluation of neutron measurements was then done using the X-ray diffraction d0distribution. High compressive residual stresses were measured in the hardened layer followed by high tensile residual stresses in the core. A comparison of the neutron measurements with X-ray diffraction (XRD) depth profiles obtained after successive layer removal showed that both methods give similar results. However, these investigations opened the question about the direct comparison of the residual stresses obtained by neutron and XRD. Indeed, a correction of the neutron data regarding the residual stresses in thickness direction might be necessary as these are released in the case of X-ray diffraction measurements after layer removal.

Test method for residual stress analysis of the inner surface of small caliber Ti-3Al-2.5V tubing by X-ray diffraction

Vacuum ◽  
2020 ◽  
Vol 177 ◽  
pp. 109371 ◽  
Author(s):  
Wenrui Wang ◽  
Lihong Yuan ◽  
Yun Li ◽  
Mengyao Yang ◽  
Hui Zhang ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Test Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Inner Surface ◽  
Residual Stress Analysis

Corrigendum to “Residual stress analysis in laser welded NiTi sheets using synchrotron X-ray diffraction” [Mater. Des., 100, 2016, 180–187]

2016 ◽  
Vol 106 ◽  
pp. 495-496
Author(s):  
J.P. Oliveira ◽  
F.M. Braz Fernandes ◽  
R.M. Miranda ◽  
N. Schell ◽  
J.L. Ocaña
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Analysis

Residual Stress Analysis of Al Alloy Thin Films by X-Ray Diffraction as a Function of Film Thickness

1988 ◽  
Vol 130 ◽  
Author(s):  
Carla J. Shute ◽  
J. B. Cohen ◽  
D. A. Jeannottea
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Film Thickness ◽  
Stress Analysis ◽  
Metal Film ◽  
High Stress ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Analysis

AbstractResidual stress has been measured as a function of layer thickness in thin films of an Al alloy on oxidized Si by the x-ray “d” versus sin2ψ technique. Samples with and without a passivation layer were examined. The results show an increase in residual stress with decreasing film thickness for the passivated samples and indicates that the interface between the metal film and SiO2 may be a region of high stress.

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